ICS854S54I-01 Datasheet
DUAL 2:1, 1:2 DIFFERENTIAL-TO-LVDS MULTIPLEXER
Table 4D. LVDS DC Characteristics, VDD = 2.5V ± 5%, TA = -40°C to 85°C
-40°C
25°C
Typ
350
85°C
Symbol Parameter
Min
Typ
Max
454
60
Min
Max
454
60
Min
Typ
Max
454
60
Units
mV
mV
V
VOD
Differential Output Voltage
247
350
247
247
350
VOD
VOS
VOD Magnitude Change
Offset Voltage
1.125
1.25
1.375
50
1.125
1.25
1.375
50
1.125
1.25
1.375
50
VOS
VOS Magnitude Change
mV
NOTE: Refer to Parameter Measurement Information, 2.5V Output Load Test Circuit diagram.
AC Electrical Characteristics
Table 5. AC Characteristics, VDD = 2.5V ± 5%, TA = -40°C to 85°C
Symbol
Parameter
Test Conditions
Minimum
Typical
Maximum
2.5
Units
GHz
ps
fOUT
Output Frequency
INAx to QB or INB to QAx
INAx to QAx
250
300
600
tPD
Propagation Delay; NOTE 1
600
ps
tsk(pp)
tjit
Part-to-Part Skew; NOTE 2, 3
300
ps
Buffer Additive Phase Jitter, RMS;
refer to Additive Phase Jitter Section
ƒOUT = 622.08MHz,
12kHz – 20MHz
0.031
65
ps
ps
dB
tR / tF
Output Rise/Fall Time
20% to 80%
60
300
ƒOUT = 500MHz output,
VPP = 400mV
MUX_ISOLATION MUX Isolation; NOTE 4
NOTE: Electrical parameters are guaranteed over the specified ambient operating temperature range, which is established when the device
is mounted in a test socket with maintained transverse airflow greater than 500 lfpm. The device will meet specifications after thermal
equilibrium has been reached under these conditions.
NOTE: All parameters measured at 1.7GHz unless otherwise noted.
NOTE 1: Measured from the differential input crossing point to the differential output crossing point.
NOTE 2: Defined as skew between outputs on different devices operating at the same supply voltage, same temperature and with equal load
conditions. Using the same type of inputs on each device, the outputs are measured at the differential cross points.
NOTE 3: This parameter is defined in accordance with JEDEC Standard 65.
NOTE 4: Q, nQ output measured differentially. See MUX Isolation Diagram in Parameter Measurement Information section.
ICS854S54I-01 July 17, 2017
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©2017 Integrated Device Technology, Inc.