IDT71V416S, IDT71V416L, 3.3V CMOS Static RAM
4 Meg (256K x 16-Bit)
Commercial and Industrial Temperature Ranges
DC Electrical Characteristics
(VDD = Min. to Max., Commercial and Industrial Temperature Ranges)
IDT71V416
Symbol
|ILI
|ILO
Parameter
Input Leakage Current
Test Conditions
Min.
Max.
Unit
µA
µA
V
___
|
V
CC = Max., VIN =
DD = Max., CS = VIH, VOUT = VSS to VDD
OL = 8mA, VDD = Min.
OH = -4mA, VDD = Min.
V
SS to VDD
5
5
___
___
|
Output Leakage Current
Output Low Voltage
Output High Voltage
V
VOL
I
0.4
___
VOH
I
2.4
V
3624 tbl 07
DC Electrical Characteristics(1, 2, 3)
(VDD = Min. to Max., VLC = 0.2V, VHC = VDD – 0.2V)
71V416S/L10
Com'l.
Ind.(5)
200 200
71V416S/L12
71V416S/L15
Com'l.
Ind.
180
170
60
Com'l.
Ind.
170
160
50
Symbol
Parameter
Dynamic Operating Current
CS < VLC, Outputs Open, VDD = Max., f = fMAX
Unit
ICC
S
L
S
L
S
L
180
170
60
170
160
50
mA
(4)
180
70
50
20
10
—
70
—
20
—
ISB
Dynamic Standby Power Supply Current
CS > VHC, Outputs Open, VDD = Max., f = fMAX
mA
(4)
45
45
40
40
ISB1
Full Standby Power Supply Current (static)
mA
20
20
20
20
CS > VHC, Outputs Open, VDD = Max., f = 0(4)
10
10
10
10
3624 tbl 08
NOTES:
IDT71V416S/71V416L
1. All values are maximum guaranteed values.
2. All inputs switch between 0.2V (Low) and VDD -0.2V (High).
3. Power specifications are preliminary.
4. fMAX = 1/tRC (all address inputs are cycling at fMAX); f = 0 means no address input lines are changing.
5. Standard power 10ns (S10) speed grade only.
3.3V
320Ω
AC Test Loads
+1.5V
50Ω
OUT
DATA
I/O
Z0 = 50Ω
5pF*
350Ω
30pF
3624 drw 03
3624 drw 04
Figure 1. AC Test Load
*Including jig and scope capacitance.
Figure 2. AC Test Load
(for tCLZ, tOLZ, tCHZ, tOHZ, tOW, and tWHZ)
7
6
5
4
3
•
AC Test Conditions
∆tAA,
tACS
(Typical, ns)
Input Pulse Levels
GND to 3.0V
1.5ns
•
•
2
1
Input Rise/Fall Times
Input Timing Reference Levels
Output Reference Levels
AC Test Load
•
•
•
1.5V
•
180
8 20 40 60 80 100 120 140 160
CAPACITANCE (pF)
200
1.5V
3624 drw 05
Figures 1,2 and 3
Figure 3. Output Capacitive Derating
3624 tbl 09
6.442