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7005S70FGB8 PDF预览

7005S70FGB8

更新时间: 2024-02-19 13:48:53
品牌 Logo 应用领域
艾迪悌 - IDT 静态存储器内存集成电路
页数 文件大小 规格书
21页 358K
描述
Dual-Port SRAM, 8KX8, 70ns, CMOS, PQFP68, 0.970 X 0.970 INCH, 0.080 INCH HEIGHT, GREEN, QFP-68

7005S70FGB8 技术参数

生命周期:Active包装说明:QFF,
Reach Compliance Code:compliant风险等级:5.59
最长访问时间:70 nsJESD-30 代码:S-PQFP-F68
JESD-609代码:e3长度:24.2062 mm
内存密度:65536 bit内存集成电路类型:DUAL-PORT SRAM
内存宽度:8功能数量:1
端子数量:68字数:8192 words
字数代码:8000工作模式:ASYNCHRONOUS
最高工作温度:125 °C最低工作温度:-55 °C
组织:8KX8封装主体材料:PLASTIC/EPOXY
封装代码:QFF封装形状:SQUARE
封装形式:FLATPACK并行/串行:PARALLEL
认证状态:Not Qualified座面最大高度:4.572 mm
最大供电电压 (Vsup):5.5 V最小供电电压 (Vsup):4.5 V
标称供电电压 (Vsup):5 V表面贴装:YES
技术:CMOS温度等级:MILITARY
端子面层:MATTE TIN端子形式:FLAT
端子节距:0.8 mm端子位置:QUAD
宽度:24.2062 mmBase Number Matches:1

7005S70FGB8 数据手册

 浏览型号7005S70FGB8的Datasheet PDF文件第5页浏览型号7005S70FGB8的Datasheet PDF文件第6页浏览型号7005S70FGB8的Datasheet PDF文件第7页浏览型号7005S70FGB8的Datasheet PDF文件第9页浏览型号7005S70FGB8的Datasheet PDF文件第10页浏览型号7005S70FGB8的Datasheet PDF文件第11页 
IDT7005S/L  
High-Speed 8K x 8 Dual-Port Static RAM  
Military, Industrial and Commercial Temperature Ranges  
Waveform of Read Cycles(5)  
t
RC  
ADDR  
(4)  
t
t
AA  
(4)  
ACE  
CE  
OE  
(4)  
tAOE  
R/W  
(1)  
tOH  
t
LZ  
VALID DATA(4)  
DATAOUT  
(2)  
HZ  
t
BUSYOUT  
(3,4)  
t
BDD  
2738 drw 07  
NOTES:  
1. Timing depends on which signal is asserted last, OE or CE.  
2. Timing depends on which signal is de-asserted first CE or OE.  
3. tBDD delay is required only in cases where the opposite port is completing a write operation to the same address location. For simultaneous read operations BUSY  
has no relation to valid output data.  
4. Start of valid data depends on which timing becomes effective last tAOE, tACE, tAA or tBDD.  
5. SEM = VIH.  
Timing of Power-Up Power-Down  
CE  
tPU  
tPD  
ICC  
ISB  
,
2738 drw 08  
6.42  
8

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