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5962F9676701V9A

更新时间： 2024-01-02 07:16:40
品牌 Logo 应用领域
其他 - ETC 运算放大器
页数 文件大小 规格书
21页 114K
描述
Operational Amplifier

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5962F9676701V9A 技术参数

生命周期：Transferred包装说明：, DIE OR CHIP
Reach Compliance Code：compliantECCN代码：USML XV(E)
HTS代码：8542.39.00.01风险等级：5.43
Is Samacsys：N放大器类型：OPERATIONAL AMPLIFIER
架构：CURRENT-FEEDBACK25C 时的最大偏置电流 (IIB)：25 µA
频率补偿：YES最大输入失调电压：10000 µV
JESD-609代码：e0低-失调：NO
标称负供电电压 (Vsup)：-5 V功能数量：1
最高工作温度：125 °C最低工作温度：-55 °C
封装等效代码：DIE OR CHIP电源：+-5 V
认证状态：Not Qualified筛选级别：38535V;38534K;883S
子类别：Operational Amplifier最大压摆率：7.5 mA
供电电压上限：6 V标称供电电压 (Vsup)：5 V
技术：BIPOLAR温度等级：MILITARY
端子面层：TIN LEAD总剂量：300k Rad(Si) V
宽带：YESBase Number Matches：1

5962F9676701V9A 数据手册

 浏览型号5962F9676701V9A的Datasheet PDF文件第8页浏览型号5962F9676701V9A的Datasheet PDF文件第9页浏览型号5962F9676701V9A的Datasheet PDF文件第10页浏览型号5962F9676701V9A的Datasheet PDF文件第12页浏览型号5962F9676701V9A的Datasheet PDF文件第13页浏览型号5962F9676701V9A的Datasheet PDF文件第14页 
3.8 Notification of change for device class M. For device class M, notification to DSCC-VA of change of product (see 6.2  
herein) involving devices acquired to this drawing is required for any change as defined in MIL-PRF-38535, appendix A.  
3.9 Verification and review for device class M. For device class M, DSCC, DSCC's agent, and the acquiring activity retain  
the option to review the manufacturer's facility and applicable required documentation. Offshore documentation shall be made  
available onshore at the option of the reviewer.  
3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in  
microcircuit group number 49 (see MIL-PRF-38535, appendix A).  
4. QUALITY ASSURANCE PROVISIONS  
4.1 Sampling and inspection. For device classes Q and V, sampling and inspection procedures shall be in accordance with  
MIL-PRF-38535 or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan  
shall not affect the form, fit, or function as described herein. For device class M, sampling and inspection procedures shall be  
in accordance with MIL-PRF-38535, appendix A.  
4.2 Screening. For device classes Q and V, screening shall be in accordance with MIL-PRF-38535, and shall be conducted  
on all devices prior to qualification and technology conformance inspection. For device class M, screening shall be in  
accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection.  
4.2.1 Additional criteria for device class M.  
a. Burn-in test, method 1015 of MIL-STD-883.  
(1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision  
level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall  
specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in  
test method 1015.  
(2) T = +125°C, minimum.  
A
b. Interim and final electrical test parameters shall be as specified in table IIA herein.  
4.2.2 Additional criteria for device classes Q and V.  
a. The burn-in test duration, test condition and test temperature, or approved alternatives shall be as specified in the  
device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained under  
document revision level control of the device manufacturer's Technology Review Board (TRB) in accordance with  
MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall  
specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test  
method 1015 of MIL-STD-883.  
b. Interim and final electrical test parameters shall be as specified in table IIA herein.  
c. Additional screening for device class V beyond the requirements of device class Q shall be as specified in  
MIL-PRF-38535, appendix B or as modified in the manufacturer’s Quality Management (QM) plan.  
4.3 Qualification inspection for device classes Q and V. Qualification inspection for device classes Q and V shall be in  
accordance with MIL-PRF-38535. Inspections to be performed shall be those specified in MIL-PRF-38535 and herein for  
groups A, B, C, D, and E inspections (see 4.4.1 through 4.4.4).  
SIZE  
STANDARD  
5962-96767  
A
MICROCIRCUIT DRAWING  
DEFENSE SUPPLY CENTER COLUMBUS  
COLUMBUS, OHIO 43216-5000  
REVISION LEVEL  
SHEET  
B
11  
DSCC FORM 2234  
APR 97  
1...891011121314...21

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