Datasheet > 5962F1023503K4A

5962F1023503K4A

更新时间： 2023-07-15 00:00:00

品牌	Logo	应用领域
英飞凌 - INFINEON		/
页数	文件大小	规格书
20页	313K
描述
Regulator,

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5962F1023503K4A 数据手册

Table IIIB. Hybrid level and element level test table.

Radiation Test

IR HIREL

Total Dose

Heavy Ion

Proton

Neutron

SMD 5962-

10235

Low Dose High Dose

ELDRS

SEU

SEL (latch- Low

High

SEE

Displacement

Hybrid Level

Testing

Rate

Rate (HDR) Characterization (upset)

up)

Energy Energy (upset) Damage (DD)

(Y)

(N))

X(84 MeV-

cm²/mg)

(N)

X(1.0X10¹¹

n/cm²⁾

(100 krads) (500 krads)

Element Level

Testing

CMOS Discrete

(SOI)

N/A

(N)

N/A

(N)

(500 krads )

Bipolar

Discrete

Devices

(500 krads )

See notes at end of table.

Table IIIB. Hybrid level and element level test table. – Continued.

Radiation Test

IR HIREL

Prompt Dose

SMD 5962-

10235

Hybrid Level

Testing

DRU

(upset)

DRL

(latch)

Parametric

(survive)

(N)

Element Level

Testing

CMOS (SOI)

(N)

Bipolar

Discrete

Devices

NOTES:

X = Radiation Testing Done Level

G = Device Mfr Guaranteed (QML-V or Class S)

(N) = Not yet tested

N/A = Not Applicable

P = Program-Specific testing

SIZE

STANDARD

5962-10235

MICROCIRCUIT DRAWING

DLA LAND AND MARITIME

REVISION LEVEL

SHEET

COLUMBUS, OHIO 43218-3990

DSCC FORM 2234

APR 97

1...13 14 151617 18 19 20

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