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5962-3826701MTX PDF预览

5962-3826701MTX

更新时间: 2024-02-08 02:34:15
品牌 Logo 应用领域
美国微芯 - MICROCHIP 可编程只读存储器电动程控只读存储器电可擦编程只读存储器内存集成电路
页数 文件大小 规格书
17页 435K
描述
EEPROM, 128KX8, 250ns, Parallel, CMOS, CPGA30

5962-3826701MTX 技术参数

生命周期:Obsolete包装说明:PGA-30
Reach Compliance Code:compliantECCN代码:3A001.A.2.C
HTS代码:8542.32.00.51风险等级:5.67
最长访问时间:250 nsJESD-30 代码:R-CPGA-P30
长度:16.5 mm内存密度:1048576 bit
内存集成电路类型:EEPROM内存宽度:8
功能数量:1端子数量:30
字数:131072 words字数代码:128000
工作模式:ASYNCHRONOUS最高工作温度:125 °C
最低工作温度:-55 °C组织:128KX8
封装主体材料:CERAMIC, METAL-SEALED COFIRED封装代码:PGA
封装形状:RECTANGULAR封装形式:GRID ARRAY
并行/串行:PARALLEL编程电压:5 V
认证状态:Not Qualified筛选级别:MIL-STD-883 Class C
座面最大高度:4.4 mm最大供电电压 (Vsup):5.5 V
最小供电电压 (Vsup):4.5 V标称供电电压 (Vsup):5 V
表面贴装:NO技术:CMOS
温度等级:MILITARY端子形式:PIN/PEG
端子节距:2.54 mm端子位置:PERPENDICULAR
宽度:14 mm最长写入周期时间 (tWC):10 ms
Base Number Matches:1

5962-3826701MTX 数据手册

 浏览型号5962-3826701MTX的Datasheet PDF文件第1页浏览型号5962-3826701MTX的Datasheet PDF文件第3页浏览型号5962-3826701MTX的Datasheet PDF文件第4页浏览型号5962-3826701MTX的Datasheet PDF文件第5页浏览型号5962-3826701MTX的Datasheet PDF文件第6页浏览型号5962-3826701MTX的Datasheet PDF文件第7页 
Description  
The AT28C010 is a high-performance Electrically Erasable and Programmable Read Only Mem-  
ory. Its one megabit of memory is organized as 131,072 words by 8 bits. Manufactured with  
Atmel’s advanced nonvolatile CMOS technology, the device offers access times to 120 ns with  
power dissipation of just 440 mW. When the device is deselected, the CMOS standby current is  
less than 300A.  
The AT28C010 is accessed like a Static RAM for the read or write cycle without the need for  
external components. The device contains a 128-byte page register to allow writing of up to 128-  
bytes simultaneously. During a write cycle, the address and 1 to 128-bytes of data are internally  
latched, freeing the address and data bus for other operations. Following the initiation of a write  
cycle, the device will automatically write the latched data using an internal control timer. The end  
of a write cycle can be detected by DATA POLLING of I/O7. Once the end of a write cycle has  
been detected a new access for a read or write can begin.  
Atmel's 28C010 has additional features to ensure high quality and manufacturability. The device  
utilizes internal error correction for extended endurance and improved data retention character-  
istics. An optional software data protection mechanism is available to guard against inadvertent  
writes. The device also includes an extra 128-bytes of EEPROM for device identification or  
tracking.  
Block Diagram  
Absolute Maximum Ratings*  
*NOTICE:  
Stresses beyond those listed under “Absolute  
Maximum Ratings” may cause permanent dam-  
age to the device. This is a stress rating only and  
functional operation of the device at these or any  
other conditions beyond those indicated in the  
operational sections of this specification is not  
implied. Exposure to absolute maximum rating  
conditions for extended periods may affect device  
reliability.  
Temperature Under Bias ............................... -55°C to +125°C  
Storage Temperature..................................... -65°C to +150°C  
All Input Voltages  
(including NC Pins)  
with Respect to Ground ...................................-0.6V to +6.25V  
All Output Voltages  
with Respect to Ground .............................-0.6V to VCC + 0.6V  
Voltage on OE and A9  
with Respect to Ground ...................................-0.6V to +13.5V  
2
AT28C010 Military  
Atmel-0010I-PEEPR-AT28C010-Datasheet_062015  

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