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2SC5617-EB-A PDF预览

2SC5617-EB-A

更新时间: 2024-11-09 15:32:27
品牌 Logo 应用领域
日电电子 - NEC ISM频段光电二极管晶体管
页数 文件大小 规格书
25页 105K
描述
RF Small Signal Bipolar Transistor, 0.03A I(C), 1-Element, L Band, Silicon, NPN, LEADLESS MINIMOLD PACKAGE-3

2SC5617-EB-A 技术参数

是否无铅: 不含铅是否Rohs认证: 符合
生命周期:Obsolete包装说明:SMALL OUTLINE, R-PDSO-F3
针数:3Reach Compliance Code:compliant
ECCN代码:EAR99风险等级:5.64
其他特性:LOW NOISE最大集电极电流 (IC):0.03 A
基于收集器的最大容量:0.7 pF集电极-发射极最大电压:6 V
配置:SINGLE最高频带:L BAND
JESD-30 代码:R-PDSO-F3JESD-609代码:e6
元件数量:1端子数量:3
封装主体材料:PLASTIC/EPOXY封装形状:RECTANGULAR
封装形式:SMALL OUTLINE峰值回流温度(摄氏度):NOT SPECIFIED
极性/信道类型:NPN认证状态:Not Qualified
表面贴装:YES端子面层:TIN BISMUTH
端子形式:FLAT端子位置:DUAL
处于峰值回流温度下的最长时间:NOT SPECIFIED晶体管元件材料:SILICON
标称过渡频率 (fT):12000 MHzBase Number Matches:1

2SC5617-EB-A 数据手册

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DATA SHEET  
NPN SILICON RF TRANSISTOR  
2SC5617  
NPN SILICON RF TRANSISTOR FOR  
HIGH-FREQUENCY LOW NOISE  
3-PIN LEAD-LESS MINIMOLD  
FEATURES  
NF = 1.5 dB TYP. @ VCE = 3 V, IC = 3 mA, f = 2 GHz  
S21e 2 = 8.5 dB TYP. @ VCE = 3 V, IC = 10 mA, f = 2 GHz  
3-pin lead-less minimold package  
ORDERING INFORMATION  
Part Number  
Quantity  
Supplying Form  
2SC5617  
50 pcs (Non reel)  
10 kpcs/reel  
• 8 mm wide embossed taping  
• Pin 2 (Base) face the perforation side of the tape  
2SC5617-T3  
Remark To order evaluation samples, contact your nearby sales office.  
The unit sample quantity is 50 pcs.  
ABSOLUTE MAXIMUM RATINGS (TA = +25°C)  
Parameter  
Collector to Base Voltage  
Collector to Emitter Voltage  
Emitter to Base Voltage  
Collector Current  
Symbol  
VCBO  
VCEO  
VEBO  
IC  
Ratings  
Unit  
V
9.0  
6.0  
V
2.0  
V
30  
mA  
mW  
°C  
°C  
P
tot Note  
140  
Total Power Dissipation  
Junction Temperature  
Storage Temperature  
Tj  
150  
Tstg  
65 to +150  
Note Mounted on 1.08 cm2 × 1.0 mm (t) glass epoxy PCB  
Because this product uses high-frequency technology, avoid excessive static electricity, etc.  
The information in this document is subject to change without notice. Before using this document, please confirm that  
this is the latest version.  
Not all devices/types available in every country. Please check with local NEC Compound Semiconductor Devices  
representative for availability and additional information.  
Document No. PU10082EJ01V0DS (1st edition)  
The mark shows major revised points.  
(Previous No. P15643EJ1V0DS00)  
Date Published January 2002 CP(K)  
Printed in Japan  
NEC Corporation 2001  
NEC Compound Semiconductor Devices 2002  

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