Datasheet > 2SC3437RTE85L

2SC3437RTE85L

更新时间： 2024-01-03 05:36:14

品牌	Logo	应用领域
东芝 - TOSHIBA		开关光电二极管晶体管
页数	文件大小	规格书
5页	231K
描述
TRANSISTOR 200 mA, 15 V, NPN, Si, SMALL SIGNAL TRANSISTOR, TO-236, BIP General Purpose Small Signal

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技术参数
数据手册

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2SC3437RTE85L 技术参数

生命周期：	Obsolete	包装说明：	SMALL OUTLINE, R-PDSO-G3
Reach Compliance Code：	unknown	ECCN代码：	EAR99
HTS代码：	8541.21.00.75	风险等级：	5.71
Is Samacsys：	N	最大集电极电流 (IC)：	0.2 A
基于收集器的最大容量：	6 pF	集电极-发射极最大电压：	15 V
配置：	SINGLE	最小直流电流增益 (hFE)：	20
JEDEC-95代码：	TO-236	JESD-30 代码：	R-PDSO-G3
元件数量：	1	端子数量：	3
最高工作温度：	125 °C	封装主体材料：	PLASTIC/EPOXY
封装形状：	RECTANGULAR	封装形式：	SMALL OUTLINE
极性/信道类型：	NPN	认证状态：	Not Qualified
表面贴装：	YES	端子形式：	GULL WING
端子位置：	DUAL	晶体管应用：	SWITCHING
晶体管元件材料：	SILICON	标称过渡频率 (fT)：	400 MHz
VCEsat-Max：	0.3 V	Base Number Matches：	1

2SC3437RTE85L 数据手册

2SC3437

TOSHIBA Transistor Silicon NPN Epitaxial Type (PCT process)

2SC3437

Ultra High Speed Switching Applications

Unit: mm

Computer, Counter Applications

•

High transition frequency: f = 400 MHz (typ.)

Low saturation voltage: V

= 0.3 V (max)

= 15 ns (typ.)

CE (sat)

High speed switching time: t

stg

Absolute Maximum Ratings (Ta = 25°C)

Characteristics

Collector-base voltage

Symbol

Rating

Unit

CBO

CEO

EBO

Collector-emitter voltage

Emitter-base voltage

Collector current

200

°C

Base current

Collector power dissipation

Junction temperature

Storage temperature range

150

125

−55~125

JEDEC

JEITA

TO-236MOD

stg

SC-59

TOSHIBA

2-3F1A

Note: Using continuously under heavy loads (e.g. the application of high

temperature/current/voltage and the significant change in

temperature, etc.) may cause this product to decrease in the

reliability significantly even if the operating conditions (i.e.

Weight: 0.012 g (typ.)

operating temperature/current/voltage, etc.) are within the absolute maximum ratings.

Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook

(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test

report and estimated failure rate, etc).

Marking

2007-11-01

12 3 4 5

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