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2SC3328-Y PDF预览

2SC3328-Y

更新时间: 2024-11-13 12:54:31
品牌 Logo 应用领域
东芝 - TOSHIBA 晶体小信号双极晶体管开关PC
页数 文件大小 规格书
5页 149K
描述
TOSHIBA Transistor Silicon NPN Epitaxial Type (PCT Process)

2SC3328-Y 技术参数

是否Rohs认证:不符合生命周期:Obsolete
零件包装代码:TO-92包装说明:CYLINDRICAL, O-PBCY-T3
针数:3Reach Compliance Code:unknown
ECCN代码:EAR99HTS代码:8541.21.00.95
风险等级:5.78Is Samacsys:N
最大集电极电流 (IC):2 A集电极-发射极最大电压:80 V
配置:SINGLE最小直流电流增益 (hFE):120
JESD-30 代码:O-PBCY-T3元件数量:1
端子数量:3最高工作温度:150 °C
封装主体材料:PLASTIC/EPOXY封装形状:ROUND
封装形式:CYLINDRICAL峰值回流温度(摄氏度):NOT SPECIFIED
极性/信道类型:NPN最大功率耗散 (Abs):0.9 W
认证状态:Not Qualified子类别:Other Transistors
表面贴装:NO端子形式:THROUGH-HOLE
端子位置:BOTTOM处于峰值回流温度下的最长时间:NOT SPECIFIED
晶体管应用:SWITCHING晶体管元件材料:SILICON
标称过渡频率 (fT):100 MHzVCEsat-Max:0.5 V
Base Number Matches:1

2SC3328-Y 数据手册

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2SC3328  
TOSHIBA Transistor Silicon NPN Epitaxial Type (PCT Process)  
2SC3328  
Power Amplifier Applications  
Power Switching Applications  
Unit: mm  
Low saturation voltage: V  
= 0.5 V (max) (I = 1 A)  
CE (sat) C  
High-speed switching: t = 1.0 μs (typ.)  
stg  
Complementary to 2SA1315  
Absolute Maximum Ratings (Ta = 25°C)  
Characteristics  
Collector-base voltage  
Symbol  
Rating  
Unit  
V
CBO  
V
CEO  
V
EBO  
80  
V
V
Collector-emitter voltage  
Emitter-base voltage  
Collector current  
80  
5
V
I
2
1
A
C
Base current  
I
A
B
Collector power dissipation  
Junction temperature  
Storage temperature range  
P
900  
mW  
°C  
°C  
C
JEDEC  
JEITA  
TO-92MOD  
T
150  
j
T
stg  
55 to 150  
TOSHIBA  
2-5J1A  
Note1: Using continuously under heavy loads (e.g. the application of high  
temperature/current/voltage and the significant change in  
Weight: 0.36 g (typ.)  
temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating  
conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/Derating Concept and Methods) and individual reliability data (i.e. reliability test report  
and estimated failure rate, etc).  
1
2009-12-21  

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