Datasheet > 2SA1242-O(2-7B2A)

2SA1242-O(2-7B2A)

更新时间： 2024-02-29 09:28:47

品牌	Logo	应用领域
东芝 - TOSHIBA		放大器晶体管
页数	文件大小	规格书
4页	149K
描述
TRANSISTOR 5000 mA, 20 V, PNP, Si, SMALL SIGNAL TRANSISTOR, 2-7B2A, 3 PIN, BIP General Purpose Small Signal

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技术参数
数据手册

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2SA1242-O(2-7B2A) 技术参数

是否Rohs认证：	不符合	生命周期：	Obsolete
包装说明：	SMALL OUTLINE, R-PSSO-G2	针数：	3
Reach Compliance Code：	unknown	ECCN代码：	EAR99
HTS代码：	8541.29.00.75	风险等级：	5.8
外壳连接：	COLLECTOR	最大集电极电流 (IC)：	5 A
集电极-发射极最大电压：	20 V	配置：	SINGLE
最小直流电流增益 (hFE)：	100	JESD-30 代码：	R-PSSO-G2
元件数量：	1	端子数量：	2
最高工作温度：	150 °C	封装主体材料：	PLASTIC/EPOXY
封装形状：	RECTANGULAR	封装形式：	SMALL OUTLINE
峰值回流温度（摄氏度）：	NOT SPECIFIED	极性/信道类型：	PNP
认证状态：	Not Qualified	表面贴装：	YES
端子形式：	GULL WING	端子位置：	SINGLE
处于峰值回流温度下的最长时间：	NOT SPECIFIED	晶体管应用：	AMPLIFIER
晶体管元件材料：	SILICON	标称过渡频率 (fT)：	170 MHz
Base Number Matches：	1

2SA1242-O(2-7B2A) 数据手册

浏览型号2SA1242-O(2-7B2A)的Datasheet PDF文件第2页

2SA1242

TOSHIBA Transistor Silicon PNP Epitaxial Type (PCT process)

2SA1242

Unit: mm

Strobe Flash Applications

Medium Power Amplifier Applications

•

Excellent h

linearity

: h

= 100 to 320 (V

= −2 V, I = −0.5 A)

FE (1)

FE (2)

CE C

= 70 (min) (V

= −2 V, I = −4 A)

•

Low collector saturation voltage

: V = −1.0 V (max) (I = −4 A, I = −0.1 A)

CE (sat)

High power dissipation

: P = 10 W (Tc = 25°C), P = 1.0 W (Ta = 25°C)

Absolute Maximum Ratings (Ta = 25°C)

Characteristics

Collector-base voltage

Symbol

Rating

Unit

CBO

CEO

EBO

−35

−20

−8

Collector-emitter voltage

Emitter-base voltage

JEDEC

JEITA

―

−5

Collector current

Base current

TOSHIBA

2-7J1A

Pulsed

−8

(Note 1)

Weight: 0.36 g (typ.)

−0.5

1.0

Ta = 25°C

Tc = 25°C

Collector power

dissipation

Junction temperature

150

°C

Storage temperature range

stg

−55 to 150

Note 1: Pulse test: Pulse width = 10 ms (max), duty cycle = 30% (max)

Note 2: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the

significant change in temperature, etc.) may cause this product to decrease in the reliability significantly

even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute

maximum ratings.

Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook

(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test

report and estimated failure rate, etc).

2010-08-27

12 3 4

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