100329QIX

更新时间： 2024-01-02 16:08:34

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100329QIX 数据手册

Absolute Maximum Ratings(Note 4)

Recommended Operating

Conditions

Storage Temperature (T_STG

Maximum Junction Temperature (T_j) +150°C

_EEPin Potential to Ground Pin

)

−65°C to +150°C

Case Temperature (T_C)

0°C to +85°C

−5.7V to −4.2V

+4.5V to +5.5V

−7.0V to +0.5V

−0.5V to +6.0V

V_EEto +0.5V

ECL Supply Voltage (V_EE

)

V_TTLPin Potential to Ground Pin

ECL Input Voltage (DC)

ECL Output Current

TTL Supply Voltage (V_TTL

)

(DC Output HIGH)

−50 mA

−0.5V to +6.0V

TTL Input Voltage (Note 6)

TTL Input Current (Note 6)

Voltage Applied to Output

in HIGH State

−30 mA to +5.0 mA

Note 4: The “Absolute Maximum Ratings” are those values beyond which

the safety of the device cannot be guaranteed. The device should not be

operated at these limits. The parametric values defined in the Electrical

Characteristics tables are not guaranteed at the absolute maximum rating.

The “Recommended Operating Conditions” table will define the conditions

for actual device operation.

3-STATE Output

−0.5V to +5.5V

Current Applied to TTL

Output in LOW State (Max)

ESD (Note 5)

twice the rated I_OL(mA)

Note 5: ESD testing conforms to MIL-STD-883, Method 3015.

Note 6: Either voltage limit or current limit is sufficient to protect inputs.

≥2000V

TTL-to-ECL DC Electrical Characteristics

V_EE= −4.2V to −5.7V, V_CC= V_CCA= GND, T_C= 0°C to +85°C, V_TTL= +4.5V to +5.5V (Note 7)

Symbol

Parameter

Min

Typ

−955

−1705

Max

Units

Conditions

V_OH

V_OL

Output HIGH Voltage

−1025

−1830

−870

_IN= V_IH(Max) or V_IL(Min)

Output LOW Voltage

Cutoff Voltage

−1620

Loading with 50Ω to −2V

OE or DIR LOW,

−2000

−1950

_IN= V_IH(Max) or V_IL(Min)

Loading with 50Ω to −2V

V_OHC

Output HIGH Voltage

Corner Point HIGH

Output LOW Voltage

Corner Point LOW

Input HIGH Voltage

Input LOW Voltage

Input HIGH Current

Breakdown Test

−1035

V_IN= V_IH(Min) or V_IL(Max)

V_OLC

Loading with 50Ω to −2V

−1610

V_IH

V_IL

I_IH

2.0

5.0

0.8

Over V_TTL, V_EE, T_CRange

µA

V_IN= +2.7V

V_IN= +5.5V

V_IN= +0.5V

1.0

I_IL

Input LOW Current

Input Clamp

−700

−1.2

V_FCD

I_IN= −18 mA

Diode Voltage

I_EE

V_EESupply Current

LE LOW, OE and DIR HIGH

Inputs Open

−189

−199

−94

_EE= −4.2V to −4.8V

_EE= −4.2V to −5.7V

Note 7: The specified limits represent the “worst case” value for the parameter. Since these values normally occur at the temperature extremes, additional

noise immunity and guardbanding can be achieved by decreasing the allowable system operating ranges. Conditions for testing shown in the tables are cho-

sen to guarantee operation under “worst case” conditions.

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