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100331WFQMLV PDF预览

100331WFQMLV

更新时间: 2024-11-21 07:23:55
品牌 Logo 应用领域
德州仪器 - TI 输出元件
页数 文件大小 规格书
9页 83K
描述
100K SERIES, TRIPLE POSITIVE EDGE TRIGGERED D FLIP-FLOP, COMPLEMENTARY OUTPUT, CQFP24, CERQUAD-24

100331WFQMLV 数据手册

 浏览型号100331WFQMLV的Datasheet PDF文件第2页浏览型号100331WFQMLV的Datasheet PDF文件第3页浏览型号100331WFQMLV的Datasheet PDF文件第4页浏览型号100331WFQMLV的Datasheet PDF文件第5页浏览型号100331WFQMLV的Datasheet PDF文件第6页浏览型号100331WFQMLV的Datasheet PDF文件第7页 
MICROCIRCUIT DATA SHEET  
Original Creation Date: 10/30/95  
Last Update Date: 04/23/04  
MN100331-X REV 1B0  
Last Major Revision Date: 08/21/96  
LOW POWER TRIPLE D FLIP-FLOP  
General Description  
The F100331 contains three D-type, edge-triggered master/slave flip-flops with true and  
complement outputs, a common clock (CPc), and Master Set (MS) and Master Reset (MR)  
inputs. Each flip-flop has individual clock (CPn), Direct Set (SDn) and Direct Clear  
(CDn) Inputs. Data enters a master when both CPn and CPc are LOW and transfers to a slave  
when CPn or CPc (or both) go HIGH. The Master Set, Master Reset and individual CDn and  
SDn inputs override the Clock inputs. All inputs have 50k ohm pull-down resistors.  
Industry Part Number  
NS Part Numbers  
100331  
100331DMQB  
100331FMQB  
100331J-QMLV  
100331W-QMLV  
100331WFQMLV  
Prime Die  
F331  
Controlling Document  
SEE FEATURES SECTION  
Processing  
Subgrp Description  
Temp (oC)  
MIL-STD-883, Method 5004  
1
Static tests at  
+25  
2
Static tests at  
+125  
-55  
3
Static tests at  
4
Dynamic tests at  
Dynamic tests at  
Dynamic tests at  
Functional tests at  
Functional tests at  
Functional tests at  
Switching tests at  
Switching tests at  
Switching tests at  
+25  
Quality Conformance Inspection  
5
+125  
-55  
6
MIL-STD-883, Method 5005  
7
+25  
8A  
8B  
9
+125  
-55  
+25  
10  
11  
+125  
-55  
1

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