5秒后页面跳转
WW20NR005FTLJ PDF预览

WW20NR005FTLJ

更新时间: 2024-04-09 18:57:58
品牌 Logo 应用领域
华新科技 - WALSIN /
页数 文件大小 规格书
7页 455K
描述
2010(5025), 0.005Ω, ±1%, 1W

WW20NR005FTLJ 数据手册

 浏览型号WW20NR005FTLJ的Datasheet PDF文件第1页浏览型号WW20NR005FTLJ的Datasheet PDF文件第2页浏览型号WW20NR005FTLJ的Datasheet PDF文件第3页浏览型号WW20NR005FTLJ的Datasheet PDF文件第4页浏览型号WW20NR005FTLJ的Datasheet PDF文件第5页浏览型号WW20NR005FTLJ的Datasheet PDF文件第7页 
Approval sheet  
TEST AND REQUIREMENTS (AEC Q200)  
TEST  
PROCEDURE  
Test 1000 hrs./ @T=125/ Un-powered.  
REQUIREMENT  
High temperature exposure  
R/R max. ±(1%+0.5mΩ)  
MIL-STD-202 Method 108 Measurement at 24±2 hours after test conclusion.  
no visible damage  
Temperature Cycling  
Test 1000 cycles (-55to +125).  
R/R max. ±(0.5%+0.5mΩ)  
JESD22 Method JA-104  
Measurement at 24±2 hours after test conclusion  
no visible damage  
Moisture Resistance  
Test 65/ 80~100%RH/ 10Cycles (t=24hrs/cycle).  
R/R max. ±(0.5%+0.5mΩ)  
MIL-STD-202 Method 106 Measurement at 24±2 hours after test conclusion.  
no visible damage  
Biased Humidity  
MIL-STD-202 Method 103 Measurement at 24±2 hours after test conclusion.  
Test 1000 hours/ @85/85% RH./ 10% of operation power.  
R/R max. ±(1%+0.5mΩ)  
no visible damage  
Operational Life  
MIL-STD-202 Method 108 Measurement at 24±2 hours after test conclusion  
Test 1000 hrs./ TA=125/ 35% of operating power.  
R/R max. ±(1%+0.5mΩ)  
no visible damage  
External Visual  
MIL-STD-883 Method 2009 workmanship  
Electrical test not required. Inspect device construction, marking and  
No visual damage and refer  
WTC marking code.  
Physical Dimensions  
JESD22 Method JB-100  
The chip dimension (L, W, T, D) prescribed in the detail specification  
shall be checked  
Within the specified tolerance  
Within product specification  
tolerance and no visible  
damage  
Mechanical Shock  
MIL-STD-202 Method 213 Velocity:12.3ft/sec.  
Test Peak value:100g's / Wave:Hail-sine / Duration:6ms /  
Vibration  
MIL-STD-202 Method 204  
R/R max. ±(0.5%+0.5mΩ)  
no visible damage  
Test 5g’s for 20min., 12 cycles each of 3 orientations.  
Resistance to Soldering  
Heat  
MIL-STD-202 Method 210  
R/R max. ±(0.5%+0.5mΩ)  
no visible damage  
Solder dipping @ 270±5for 10±1sec.  
Thermal Shock  
Test -55 to 155/ dwell time 15min/ Max transfer time 20sec/  
R/R max. ±(0.5%+0.5mΩ)  
MIL-STD-202 Method 107 300cycles.  
no visible damage  
ESD  
AEC-Q200-002  
R/R max. ±(1%+0.5mΩ)  
no visible damage  
Test contact 1KV(min)  
a) Bake for 155dwell time 4hrs/ solder dipping 235/ 5sec.  
b) Steam the sample dwell time 8 hour/ solder dipping 215/ 5sec.  
Solderability  
good tinning (>95% covered)  
no visible damage  
J-STD-002  
c) Steam the sample dwell time 8 hour/ solder dipping 260/ 7sec.  
Natural resistance change per change in degree centigrade.  
Temperature Coefficient of  
Resistance(T.C.R)  
Refer to  
“QUICK REFERENCE DATA”  
R2 R  
106 (ppm/C) t1 : 20°C+5°C-1°C  
1
Clause 4.8  
R
1t2 t1  
R1 : Resistance at reference temperature  
R2 : Resistance at test temperature  
Bending 2mm (Min).  
Board flex  
R/R max. ±(0.5%+0.5mΩ)  
AEC-Q200-005  
Termination strength  
AEC-Q200-006  
no visible damage  
Force: 1.8kg for 60sec.  
No cracking or no part being  
sheared off from its pad.  
Page 6 of 7  
ASC_WW20N_J_AUTO_V01  
MAR 2017  

与WW20NR005FTLJ相关器件

型号 品牌 描述 获取价格 数据表
WW20NR005JTL WALSIN 2010(5025), 0.005Ω, ±5%, 1W

获取价格

WW20NR005JTLJ WALSIN 2010(5025), 0.005Ω, ±5%, 1W

获取价格

WW20NR010FTL WALSIN 2010(5025), 0.010Ω, ±1%, 1W

获取价格

WW20NR010FTLJ WALSIN 2010(5025), 0.010Ω, ±1%, 1W

获取价格

WW20NR010JTL WALSIN 2010(5025), 0.010Ω, ±5%, 1W

获取价格

WW20NR010JTLJ WALSIN 2010(5025), 0.010Ω, ±5%, 1W

获取价格