Datasheet > WW12WR056FTLJ

WW12WR056FTLJ

更新时间： 2024-04-09 18:55:48

品牌	Logo	应用领域
华新科技 - WALSIN		/
页数	文件大小	规格书
9页	836K
描述
1206(3216), 0.056Ω, ±1%, 1/3W

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WW12WR056FTLJ 数据手册

Approval sheet

TEST AND REQUIREMENTS(AEC Q200)

TEST PROCEDURE

REQUIREMENT

Temperature Coefficient Natural resistance change per change in degree centigrade. Refer to

of Resistance(T.C.R)

“QUICK REFERENCE

DATA”

R₂ R

₁t₂ t₁

10⁶(ppm/C) t₁: 25°C

Clause 4.8

R₁: Resistance at reference temperature 25°C

R₂: Resistance at test temperature 155°C

High temperature

exposure

Test 1000 hrs./ @T=155℃/ Un-powered.

J: R/R max. ±(3%+0.5m)

F: R/R max. ±(1%+0.5m)

no visible damage

Measurement at 24±2 hours after test conclusion.

MIL-STD-202-Method

108

Temperature cycling

JESD22 Method

JA-104

30 minutes at -55C3C, 2~3 minutes at 20°C+5°C-1°C, 30 J: R/R max. ±(1%+0.5m)

minutes at +125C3C, 2~3 minutes at 20°C+5°C-1°C, 1000

cycles

F: R/R max.

±(0.5%+0.5m) no visible

damage

Moisture resistance

Test 65℃/ 80~100%RH/ 10Cycles(t=24hrs/cycle).

J: R/R max. ±(1%+0.5m)

F: R/R max.

±(0.5%+0.5m) no visible

MIL-STD-202-Method

106

Measurement at 24±2 hours after test conclusion.

damage

Bias Humidity

Test 1000 hours/ @85℃/85% RH./ 10% of operation power.

J: R/R max. ±(3%+0.5m)

F: R/R max. ±(1%+0.5m)

no visible damage

MIL-STD-202-Method

103

Measurement at 24±2 hours after test conclusion.

Operation life

Test 1000 hrs./ TA=125℃ / 35% of operating power.

J: R/R max. ±(3%+0.5m)

F: R/R max. ±(1%+0.5m)

no visible damage

MIL-STD-202-Method

108

Measurement at 24±2 hours after test conclusion.

External visual

Electrical test not required. Inspect device construction,

marking and workmanship

no visible damage and

marking follow spec

MIL-STD-883-Method

2009

Physical dimensions

JESD22 Method

JB-100

The chip dimension (L, W, C, D, T) prescribed in the detail

specification shall be checked by Protech 2.5D.

Within spec defined

Mechanic shock

Test Peak value:100g's / Wave: Hail-sine / Duration:6ms /

Velocity:12.3ft/sec.

no visible damage and

within specified tolerance

MIL-STD-202-Method

213

Vibration

Test 5g’s for 20min., 12 cycles each of 3 orientations

J: R/R max. ±(1%+0.5m)

F: R/R max.

±(0.5%+0.5m) no visible

MIL-STD-202-Method

204

damage

Resistance to soldering

heat(R.S.H)

Un-mounted chips completely immersed for 10±1 second in a

SAC solder bath at 270℃±5ºC

J: R/R max. ±(1%+0.5m)

F: R/R max.

MIL-STD-202-Method

210

±(0.5%+0.5m) no visible

damage

Thermal shock

Test -55 to 155℃/ dwell time 15min/ Max transfer time 20sec/

300cycles

J: R/R max. ±(1%+0.5m)

F: R/R max.

±(0.5%+0.5m) no visible

MIL-STD-202-Method

107

damage

Page 7 of 9

ASC_WWxxW_J_AUTO_V04

Dec – 2023

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