型号 | 品牌 | 替代类型 | 描述 | 数据表 |
SN74ACT74MDREP | TI |
完全替代 ![]() |
DUAL POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOP WITH CLEAR AND PRESET |
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MC74ACT74DG | ONSEMI |
功能相似 ![]() |
Dual D−Type Positive Edge−Triggered Flip−Flop |
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SN74ACT74DR | TI |
功能相似 ![]() |
DUAL POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH CLEAR AND PRESET |
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型号 | 品牌 | 获取价格 | 描述 | 数据表 |
V62/04726-01XE | TI |
获取价格 |
NANOPOWER PUSH-PULL OUTPUT COMPARATOR |
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V62/04728-01 | NSC |
获取价格 |
Enhanced Plastic 2.4V, 10uA, SC70, micro SMD Temperature Sensor |
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V62/04729-01XE | TI |
获取价格 |
3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS |
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V62/04730-01XE | TI |
获取价格 |
具有 18 位通用总线收发器的增强型产品 3.3V Abt 扫描测试设备 | DGG | |
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V62/04731-01XE | TI |
获取价格 |
3.3-V ABT SVAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS |
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V62/04732-01XE | TI |
获取价格 |
SINGLE 2-INPUT POSITIVE-NAND GATE |
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V62/04732-02XE | TI |
获取价格 |
SINGLE 2-INPUT POSITIVE-NAND GATE |
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V62/04732-02YE | TI |
获取价格 |
SINGLE 2-INPUT POSITIVE-NAND GATE |
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V62/04733-01XE | TI |
获取价格 |
SINGLE 2-INPUT POSITIVE-AND GATE |
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V62/04733-02XE | TI |
获取价格 |
SINGLE 2-INPUT POSITIVE-AND GATE |
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