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V62/04735-01XE PDF预览

V62/04735-01XE

更新时间： 2024-11-24 12:17:03
品牌 Logo 应用领域
德州仪器 - TI 总线驱动器总线收发器触发器逻辑集成电路光电二极管输出元件栅
页数 文件大小 规格书
13页 373K
描述
SINGLE BUS BUFFER GATE WITH 3-STATE OUTPUT

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V62/04735-01XE 技术参数

是否无铅：不含铅是否Rohs认证：符合
生命周期：Active零件包装代码：SOIC
包装说明：SC-70, 5 PIN针数：5
Reach Compliance Code：compliantHTS代码：8542.39.00.01
Factory Lead Time：1 week风险等级：5.14
Is Samacsys：N控制类型：ENABLE LOW
计数方向：UNIDIRECTIONAL系列：LVC/LCX/Z
JESD-30 代码：R-PDSO-G5JESD-609代码：e4
长度：2 mm负载电容（CL）：50 pF
逻辑集成电路类型：BUS DRIVER最大I（ol）：0.032 A
湿度敏感等级：1位数：1
功能数量：1端口数量：2
端子数量：5最高工作温度：85 °C
最低工作温度：-40 °C输出特性：3-STATE
输出极性：TRUE封装主体材料：PLASTIC/EPOXY
封装代码：TSSOP封装等效代码：TSSOP5/6,.08
封装形状：RECTANGULAR封装形式：SMALL OUTLINE, THIN PROFILE, SHRINK PITCH
包装方法：TR峰值回流温度（摄氏度）：260
电源：3.3 V最大电源电流（ICC）：0.01 mA
Prop。Delay @ Nom-Sup：4.5 ns传播延迟（tpd）：9 ns
认证状态：Not Qualified施密特触发器：NO
座面最大高度：1.1 mm子类别：Gates
最大供电电压 (Vsup)：5.5 V最小供电电压 (Vsup)：1.65 V
标称供电电压 (Vsup)：1.8 V表面贴装：YES
技术：CMOS温度等级：INDUSTRIAL
端子面层：Nickel/Palladium/Gold (Ni/Pd/Au)端子形式：GULL WING
端子节距：0.65 mm端子位置：DUAL
处于峰值回流温度下的最长时间：NOT SPECIFIED翻译：N/A
宽度：1.25 mmBase Number Matches：1

V62/04735-01XE 数据手册

 浏览型号V62/04735-01XE的Datasheet PDF文件第2页浏览型号V62/04735-01XE的Datasheet PDF文件第3页浏览型号V62/04735-01XE的Datasheet PDF文件第4页浏览型号V62/04735-01XE的Datasheet PDF文件第5页浏览型号V62/04735-01XE的Datasheet PDF文件第6页浏览型号V62/04735-01XE的Datasheet PDF文件第7页 
SN74LVC1G125-EP  
SINGLE BUS BUFFER GATE  
WITH 3-STATE OUTPUT  
www.ti.com  
SCES455B–DECEMBER 2003–REVISED JUNE 2006  
FEATURES  
•
Controlled Baseline  
•
•
•
Low Power Consumption, 10-µA Max ICC  
±24-mA Output Drive at 3.3 V  
– One Assembly/Test Site, One Fabrication  
Site  
Ioff Supports Partial-Power-Down Mode  
Operation  
•
Enhanced Diminishing Manufacturing  
Sources (DMS) Support  
•
•
Latch-Up Performance Exceeds 100 mA Per  
JESD 78, Class II  
•
•
•
•
•
Enhanced Product-Change Notification  
(1)  
Qualification Pedigree  
ESD Protection Exceeds JESD 22  
– 2000-V Human-Body Model (A114-A)  
– 200-V Machine Model (A115-A)  
Supports 5-V VCC Operation  
Inputs Accept Voltages to 5.5 V  
Max tpd of 3.7 ns at 3.3 V  
– 1000-V Charged-Device Model (C101)  
(1) Component qualification in accordance with JEDEC and  
industry standards to ensure reliable operation over an  
extended temperature range. This includes, but is not limited  
to, Highly Accelerated Stress Test (HAST) or biased 85/85,  
temperature cycle, autoclave or unbiased HAST,  
DCK PACKAGE  
(TOP VIEW)  
1
2
3
5
4
OE  
A
V
Y
CC  
electromigration, bond intermetallic life, and mold compound  
life. Such qualification testing should not be viewed as  
justifying use of this component beyond specified  
performance and environmental limits.  
GND  
DESCRIPTION/ORDERING INFORMATION  
This bus buffer gate is designed for 1.65-V to 5.5-V VCC operation.  
The SN74LVC1G125 is a single line driver with a 3-state output. The output is disabled when the output-enable  
(OE) input is high.  
This device is fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs,  
preventing damaging current backflow through the device when it is powered down.  
To ensure the high-impedance state during power up or power down, OE should be tied to VCC through a pullup  
resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver.  
ORDERING INFORMATION  
TA  
PACKAGE(1)  
ORDERABLE PART NUMBER  
CLVC1G125IDCKREP  
TOP-SIDE MARKING  
–40°C to 85°C  
–55°C to 125°C  
SOT (SC-70) – DCK  
SOT (SC-70) – DCK  
Reel of 3000  
Reel of 3000  
CMO  
CMO  
CLVC1G125MDCKREP  
(1) Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are available at  
www.ti.com/sc/package.  
FUNCTION TABLE  
INPUTS  
OUTPUT  
Y
OE  
L
A
H
L
H
L
L
H
X
Z
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas  
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
PRODUCTION DATA information is current as of publication date.  
Copyright © 2003–2006, Texas Instruments Incorporated  
Products conform to specifications per the terms of the Texas  
Instruments standard warranty. Production processing does not  
necessarily include testing of all parameters.  
1234567...13

中文翻译

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V62/04735-01XE 替代型号

型号 品牌 替代类型 描述 数据表
CLVC1G125IDCKREP TI

完全替代

 SINGLE BUS BUFFER GATE WITH 3-STATE OUTPUT
CLVC1G125MDCKREP TI

类似代替

 SINGLE BUS BUFFER GATE WITH 3-STATE OUTPUT
1P1G125QDCKRQ1 TI

类似代替

 SINGLE BUS BUFFER GATE WITH 3-STATE OUTPUT

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