Datasheet > UF15N0R5Q250CG

UF15N0R5Q250CG

更新时间： 2022-05-14 22:13:37

品牌	Logo	应用领域
华新科技 - WALSIN		/
页数	文件大小	规格书
8页	2542K
描述
Microwave MLCC with Narrow-Tolerance

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UF15N0R5Q250CG 数据手册

Multilayer Ceramic Capacitors

Approval Sheet

9. RELIABILITY TEST CONDITIONS AND REQUIREMENTS

No.

Item

Test Conditions

Requirements

1. Visual and

Mechanical

---

* No remarkable defect.

* Dimensions to conform to individual specification sheet.

2. Capacitance

3. Q/ D.F.

(Dissipation

Factor)

1.0±0.2Vrms, 1MHz±10%

* Shall not exceed the limits given in the detailed spec.

At 25°C ambient temperature.

* 0402/25V~50V: Q≥400+20C

*To apply voltage: 250% of rated voltage.

*Duration: 1 to 5 sec.

4. Dielectric

Strength

* No evidence of damage or flash over during test.

*Charge & discharge current less than 50mA.

5. Insulation

Resistance

To apply rated voltage for max. 120 sec.

≥10GΩ or RxC≥100Ω-F whichever is smaller

6. Temperature

Coefficient

With no electrical load.

* Capacitance change: within ±30ppm/°C;

Operating temperature: -55~125°C at 25°C

7. Adhesive

Strength of

Termination

8. Vibration

Resistance

* Pressurizing force：

* No remarkable damage or removal of the terminations.

0402 to 0603: 5N

* Test time: 10±1 sec.

* Vibration frequency: 10~55 Hz/min.

* Total amplitude: 1.5mm

* No remarkable damage.

* Cap change and Q/D.F.: To meet initial spec.

* Test time: 6 hrs. (Two hrs each in three mutually

perpendicular directions.)

*Cap./DF(Q) Measurement to be made after de-aging at 150°C

for 1hr then set for 24±2 hrs at room temp.

* Solder temperature: 235±5°C

* Dipping time: 2±0.5 sec.

9. Solderability

95% min. coverage of all metalized area.

10. Bending Test * The middle part of substrate shall be pressurized by means * No remarkable damage.

of the pressurizing rod at a rate of about 1 mm per second until * Cap change: within ±5.0% or ±0.5pF whichever is larger.

the deflection becomes 1 mm and then the pressure shall be

maintained for 5±1 sec.

(This capacitance change means the change of capacitance under

specified flexure of substrate from the capacitance measured before

the test.)

* Measurement to be made after keeping at room temp. for

24±2 hrs.

11. Resistance to * Solder temperature: 260±5°C

Soldering Heat * Dipping time: 10±1 sec

* Preheating: 120 to 150°C for 1 minute before imme rse the

* No remarkable damage.

* Cap change: within ±2.5% or ±0.25pF whichever is larger.

* Q/D.F., I.R. and dielectric strength: To meet initial requirements.

* 25% max. leaching on each edge.

capacitor in a eutectic solder.

*Cap. / DF(Q) / I.R. Measurement to be made after de-aging at

150°C for 1hr then set for 24±2 hrs at room temp.

Page 5 of 8

ASC_Microwave_with_Narrow_Tol_(UF)

Jul. 2019

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