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UC1843TD1 PDF预览

UC1843TD1

更新时间: 2024-11-04 12:30:27
品牌 Logo 应用领域
德州仪器 - TI 控制器
页数 文件大小 规格书
4页 54K
描述
CURRENT MODE PWM CONTROLLER

UC1843TD1 技术参数

生命周期:Active包装说明:DIE,
Reach Compliance Code:not_compliantECCN代码:EAR99
HTS代码:8542.39.00.01Factory Lead Time:6 weeks
风险等级:5.75模拟集成电路 - 其他类型:SWITCHING CONTROLLER
控制模式:CURRENT-MODE控制技术:PULSE WIDTH MODULATION
JESD-30 代码:X-XUUC-N功能数量:1
封装主体材料:UNSPECIFIED封装代码:DIE
封装形状:UNSPECIFIED封装形式:UNCASED CHIP
峰值回流温度(摄氏度):NOT SPECIFIED表面贴装:YES
切换器配置:BOOST端子形式:NO LEAD
端子位置:UPPER处于峰值回流温度下的最长时间:NOT SPECIFIED
Base Number Matches:1

UC1843TD1 数据手册

 浏览型号UC1843TD1的Datasheet PDF文件第2页浏览型号UC1843TD1的Datasheet PDF文件第3页浏览型号UC1843TD1的Datasheet PDF文件第4页 
UC1843-DIE  
www.ti.com  
SLUSBN6 JULY 2013  
CURRENT MODE PWM CONTROLLER  
Check for Samples: UC1843-DIE  
1
FEATURES  
Optimized For Off-line and DC-to-DC  
Converters  
Enhanced Load Response Characteristics  
Under-Voltage Lockout With Hysteresis  
Low Start-Up Current  
Double Pulse Suppression  
High Current Totem Pole Output  
Low RO Error Amp  
Automatic Feed Forward Compensation  
Pulse-by-Pulse Current Limiting  
DESCRIPTION  
The UC1843-DIE provides the necessary features to implement off-line or dc-to-dc fixed frequency current mode  
control schemes with a minimal external parts count. Internally implemented circuits include under-voltage  
lockout featuring start up current, logic to insure latched operation, a PWM comparator which also provides  
current limit control, and a totem pole output stage designed to source or sink high peak current. The output  
stage, suitable for driving N-Channel MOSFETs, is low in the off state.  
ORDERING INFORMATION(1)  
PACKAGE  
DESIGNATOR  
PRODUCT  
PACKAGE  
ORDERABLE PART NUMBER  
PACKAGE QUANTITY  
UC1843TD1  
UC1843TD2  
154  
10  
UC1843  
TD  
Bare die in waffle pack(2)  
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI  
web site at www.ti.com.  
(2) Processing is per the Texas Instruments commercial production baseline and is in compliance with the Texas Instruments Quality  
Control System in effect at the time of manufacture. Electrical screening consists of DC parametric and functional testing at room  
temperature only. Unless otherwise specified by Texas Instruments AC performance and performance over temperature is not  
warranted. Visual Inspection is performed in accordance with MIL-STD-883 Test Method 2010 Condition B at 75X minimum.  
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
PRODUCTION DATA information is current as of publication date.  
Copyright © 2013, Texas Instruments Incorporated  
Products conform to specifications per the terms of the Texas  
Instruments standard warranty. Production processing does not  
necessarily include testing of all parameters.  

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