TPS73601-Q1, TPS73625-Q1, TPS73633-Q1
www.ti.com
SLVSAI3 –SEPTEMBER 2010
Cap-Free, NMOS, 400mA Low-Dropout Regulator
with Reverse Current Protection
Check for Samples: TPS73601-Q1, TPS73625-Q1, TPS73633-Q1
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FEATURES
DESCRIPTION
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Qualified for Automotive Applications
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Stable with No Output Capacitor or Any Value
or Type of Capacitor
The TPS736xx family of low-dropout (LDO) linear
voltage regulators uses a new topology: an NMOS
pass element in a voltage-follower configuration. This
topology is stable using output capacitors with low
ESR, and even allows operation without a capacitor.
It also provides high reverse blockage (low reverse
current) and ground pin current that is nearly constant
over all values of output current.
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Input Voltage Range of 1.7V to 5.5V
Ultra-Low Dropout Voltage: 75mV typ
Excellent Load Transient Response—with or
without Optional Output Capacitor
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New NMOS Topology Delivers Low Reverse
Leakage Current
The TPS736xx uses an advanced BiCMOS process
to yield high precision while delivering very low
dropout voltages and low ground pin current. Current
consumption, when not enabled, is under 1mA and
ideal for portable applications. The extremely low
output noise (30mVRMS with 0.1mF CNR) is ideal for
powering VCOs. These devices are protected by
thermal shutdown and foldback current limit.
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Low Noise: 30mVRMS typ (10Hz to 100kHz)
0.5% Initial Accuracy
1% Overall Accuracy Over Line, Load, and
Temperature
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Less Than 1mA max IQ in Shutdown Mode
Thermal Shutdown and Specified Min/Max
Current Limit Protection
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Available in Multiple Output Voltage Versions
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Fixed Outputs of 1.20V to 3.3V
Adjustable Output from 1.20V to 5.5V
Optional
Optional
VIN
VOUT
IN
OUT
TPS736xx
GND
EN
NR
ON
OFF
Optional
Typical Application Circuit for Fixed-Voltage Versions
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Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
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PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2010, Texas Instruments Incorporated