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TPS616(AB,F) PDF预览

TPS616(AB,F)

更新时间: 2024-11-23 20:01:47
品牌 Logo 应用领域
东芝 - TOSHIBA 光电
页数 文件大小 规格书
6页 195K
描述
Photo Transistor, PHOTO TRANSISTOR DETECTOR, LEAD FREE, PLASTIC, 0-3D1, 2 PIN

TPS616(AB,F) 技术参数

是否无铅: 不含铅是否Rohs认证: 符合
生命周期:End Of Life包装说明:LEAD FREE, PLASTIC, 0-3D1, 2 PIN
Reach Compliance Code:unknownHTS代码:8541.40.70.80
风险等级:5.61Coll-Emtr Bkdn Voltage-Min:30 V
配置:SINGLE最大暗电源:100 nA
红外线范围:YES标称光电流:0.01 mA
安装特点:THROUGH HOLE MOUNT功能数量:1
最大通态电流:0.02 A最高工作温度:85 °C
最低工作温度:-30 °C光电设备类型:PHOTO TRANSISTOR
峰值波长:900 nm最大功率耗散:0.075 W
形状:ROUND尺寸:3.1 mm
子类别:Photo Transistors表面贴装:NO
Base Number Matches:1

TPS616(AB,F) 数据手册

 浏览型号TPS616(AB,F)的Datasheet PDF文件第2页浏览型号TPS616(AB,F)的Datasheet PDF文件第3页浏览型号TPS616(AB,F)的Datasheet PDF文件第4页浏览型号TPS616(AB,F)的Datasheet PDF文件第5页浏览型号TPS616(AB,F)的Datasheet PDF文件第6页 
TPS616(F)  
TOSHIBA Phototransistor Silicon NPN Epitaxial Planar  
TPS616(F)  
Floppy Disk Drive  
VCR  
Unit in mm  
Position Detector Of Home Electric Equipment  
Opto-electronic Switch  
φ3.1mm epoxy resin package. (black)  
Light current: I = 10μA (min.) at E = 0.1mW/cm2  
L
Half value angle: θ1/2 = ±30° (typ.)  
Protected from external light by black mold packaging.  
Absolute Maximum Ratings (Ta = 25°C)  
Characteristic  
Symbol  
Rating  
Unit  
Collector-emitter voltage  
Emitter-collector voltage  
Collector current  
V
V
30  
5
V
V
CEO  
ECO  
TOSHIBA  
03D1  
I
20  
75  
mA  
mW  
C
Weight: 0.12g (typ.)  
Collector power dissipation  
P
C
Collector power dissipation  
derating (Ta > 25°C)  
ΔP /°C  
1  
mW/°C  
C
Pin Connection  
Operating temperature range  
Storage temperature range  
T
30~85  
°C  
°C  
opr  
1
T
30~100  
stg  
1 . Emitter  
2 . Collector  
Note: Using continuously under heavy loads (e.g. the application of high  
temperature/current/voltage and the significant change in  
temperature, etc.) may cause this product to decrease in the  
reliability significantly even if the operating conditions (i.e. operating  
temperature/current/voltage, etc.) are within the absolute maximum  
ratings.  
2
Please design the appropriate reliability upon reviewing the Toshiba  
Semiconductor Reliability Handbook (“Handling  
Precautions”/“Derating Concept and Methods”) and individual  
reliability data (i.e. reliability test report and estimated failure rate,  
etc).  
2007-10-01  
1

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