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TPS40042_16 PDF预览

TPS40042_16

更新时间: 2024-11-22 02:58:19
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德州仪器 - TI 输入元件
页数 文件大小 规格书
35页 834K
描述
LOW PIN COUNT, LOW VIN (3.0 V TO 5.5 V) SYNCHRONOUS BUCK DC-TO-DC CONTROLLER WITH EXTERNAL REFERENCE INPUT

TPS40042_16 数据手册

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TPS40042  
www.ti.com  
SLUS777NOVEMBER 2007  
LOW PIN COUNT, LOW V (3.0 V TO 5.5 V) SYNCHRONOUS BUCK DC-TO-DC  
IN  
CONTROLLER WITH EXTERNAL REFERENCE INPUT  
1
FEATURES  
CONTENTS  
2
3.0-V to 5.5-V Input  
External Reference required: 0.5 V to 1.5 V  
Output Voltage from REFIN to 90% of VIN  
High-Side Drive for N-Channel FET  
Supports Pre-Biased Outputs  
Device Ratings  
2
4
Electrical Characteristics  
Device Information  
Application Information  
Design Examples  
8
10  
18  
28  
Adaptive Anti-Cross Conduction Gate Drive  
Fixed switching frequency (600 kHz) Voltage  
Mode Control  
Additional References  
Three Selectable Short Circuit Protection  
Levels  
DESCRIPTION  
Hiccup Restart from Faults  
Active Low Enable  
The TPS40042 DC/DC controller is designed to  
operate with an input source between a 3.0 V and 5.5  
V. To reduce the number of external components, a  
number of operating parameters are fixed internally.  
The operating frequency for example, is internally set  
at 600 kHz. (Continued)  
Thermal Shutdown Protection at 145°C  
10-Pin, 3-mm x 3-mm SON (DRC)  
APPLICATIONS  
DDR Memory  
Point of Load  
Telecommunications  
DC to DC Modules  
V
IN  
TPS40042  
HDRV 10  
Reference Input  
1
2
3
4
5
REFIN  
EN  
SW  
BOOT  
LDRV  
GND  
9
8
7
6
V
OUT  
Enable  
FB  
COMP  
VDD  
UDG-07141  
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
2
Predictive Gate Drive is a registered trademark of Texas Instruments.  
PRODUCTION DATA information is current as of publication date.  
Products conform to specifications per the terms of the Texas  
Instruments standard warranty. Production processing does not  
necessarily include testing of all parameters.  
Copyright © 2007, Texas Instruments Incorporated  

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