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TPS3808G01QDRVRQ1 PDF预览

TPS3808G01QDRVRQ1

更新时间: 2024-11-20 11:58:27
品牌 Logo 应用领域
德州仪器 - TI 电源电路电源管理电路光电二极管监控输入元件PC
页数 文件大小 规格书
20页 785K
描述
LOW-QUIESCENT-CURRENT PROGRAMMABLE-DELAY SUPERVISORY CIRCUIT

TPS3808G01QDRVRQ1 技术参数

是否无铅:不含铅是否Rohs认证:符合
生命周期:Active零件包装代码:SON
包装说明:HVSON, SOLCC6,.07,25针数:6
Reach Compliance Code:compliantECCN代码:EAR99
HTS代码:8542.39.00.01Factory Lead Time:1 week
风险等级:1.64Samacsys Confidence:
Samacsys Status:ReleasedSamacsys PartID:607704
Samacsys Pin Count:7Samacsys Part Category:Integrated Circuit
Samacsys Package Category:OtherSamacsys Footprint Name:SON65P200X200X80-7N
Samacsys Released Date:2017-01-12 12:59:53Is Samacsys:N
其他特性:RESET THRESHOLD VOLTAGE IS 0.405V; MANUAL RESET INPUT; POWER ON RESET GENERATOR可调阈值:YES
模拟集成电路 - 其他类型:POWER SUPPLY SUPPORT CIRCUITJESD-30 代码:S-PDSO-N6
JESD-609代码:e4长度:2 mm
湿度敏感等级:2信道数量:1
功能数量:1端子数量:6
最高工作温度:125 °C最低工作温度:-40 °C
封装主体材料:PLASTIC/EPOXY封装代码:HVSON
封装等效代码:SOLCC6,.07,25封装形状:SQUARE
封装形式:SMALL OUTLINE, HEAT SINK/SLUG, VERY THIN PROFILE峰值回流温度(摄氏度):260
电源:1.8/6.5 V认证状态:Not Qualified
座面最大高度:0.8 mm子类别:Power Management Circuits
最大供电电流 (Isup):0.006 mA最大供电电压 (Vsup):6.5 V
最小供电电压 (Vsup):1.8 V标称供电电压 (Vsup):3.3 V
表面贴装:YES温度等级:AUTOMOTIVE
端子面层:Nickel/Palladium/Gold (Ni/Pd/Au)端子形式:NO LEAD
端子节距:0.65 mm端子位置:DUAL
阈值电压标称:.405V处于峰值回流温度下的最长时间:NOT SPECIFIED
宽度:2 mmBase Number Matches:1

TPS3808G01QDRVRQ1 数据手册

 浏览型号TPS3808G01QDRVRQ1的Datasheet PDF文件第2页浏览型号TPS3808G01QDRVRQ1的Datasheet PDF文件第3页浏览型号TPS3808G01QDRVRQ1的Datasheet PDF文件第4页浏览型号TPS3808G01QDRVRQ1的Datasheet PDF文件第5页浏览型号TPS3808G01QDRVRQ1的Datasheet PDF文件第6页浏览型号TPS3808G01QDRVRQ1的Datasheet PDF文件第7页 
TPS3808-Q1  
www.ti.com  
SBVS085H JANUARY 2007REVISED JUNE 2012  
LOW-QUIESCENT-CURRENT PROGRAMMABLE-DELAY SUPERVISORY CIRCUIT  
Check for Samples: TPS3808-Q1  
1
FEATURES  
DESCRIPTION  
Qualified for Automotive Applications  
The TPS3808 microprocessor supervisory circuits  
monitor system voltages from 0.4 V to 5 V, asserting  
an open-drain RESET signal when the SENSE  
voltage drops below a preset threshold or when the  
manual reset (MR) pin drops to a logic low. The  
RESET output remains low for the user-adjustable  
delay time after the SENSE voltage and MR return  
above their thresholds.  
Power-On Reset Generator With Adjustable  
Delay Time: 1.25 ms to 10 s  
Very Low Quiescent Current: 2.4 μA Typ  
High Threshold Accuracy: 0.5% Typ  
Fixed Threshold Voltages for Standard Voltage  
Rails From 1.2 V to 5 V and Adjustable Voltage  
Down to 0.4 V Are Available  
The TPS3808 uses a precision reference to achieve  
0.5% threshold accuracy for VIT 3.3 V. The reset  
delay time can be set to 20 ms by disconnecting the  
CT pin, 300 ms by connecting the CT pin to VDD using  
a resistor, or can be user adjusted between 1.25 ms  
and 10 s by connecting the CT pin to an external  
capacitor. The TPS3808 has a very low typical  
quiescent current of 2.4 μA, so it is well suited to  
battery-powered applications. It is available in a small  
SOT-23 package and is fully specified over a  
temperature range of –40°C to 125°C (TJ).  
Manual Reset (MR) Input  
Open-Drain RESET Output  
Temperature Range: –40°C to 125°C  
Small SOT-23 Package  
APPLICATIONS  
DSP or Microcontroller Applications  
Notebook/Desktop Computers  
PDAs/Hand-Held Products  
<br/>  
<br/>  
<br/>  
Portable/Battery-Powered Products  
FPGA/ASIC Applications  
DBV (SOT-23) PACKAGE  
(TOP VIEW)  
1.2 V  
3.3 V  
6
5
4
1
2
3
RESET  
GND  
MR  
VDD  
SENSE  
CT  
VI/O VCORE  
SENSE VDD  
SENSE VDD  
TPS3808G12  
TPS3808G33  
DSP  
RESET  
MR  
RESET  
GPIO  
GND  
DRV PACKAGE  
(TOP VIEW)  
CT  
CT  
GND  
GND  
VDD  
1
2
3
6
5
4
RESET  
SENSE  
CT  
GND  
MR  
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
PRODUCTION DATA information is current as of publication date.  
Products conform to specifications per the terms of the Texas  
Instruments standard warranty. Production processing does not  
necessarily include testing of all parameters.  
Copyright © 2007–2012, Texas Instruments Incorporated  

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