TPA65R4K3C,TPP65R4K3C,TPU65R4K3C,TPD65R4K3C
Wuxi Unigroup Microelectronics Company
Specifications TJ = 25ºC, unless otherwise noted
Value
Typ.
Parameter
Symbol
Test Conditions
Unit
Min.
Max.
Static
Drain-Source Breakdown Voltage
V(BR)DSS
VGS = 0V, ID = 250µA
650
--
--
--
--
1
V
VDS = 650V, VGS = 0V, TJ = 25ºC
Zero Gate Voltage Drain Current
IDSS
μA
V
DS = 650V, VGS = 0V, TJ = 150ºC
--
--
100
±100
4.0
4.3
--
Gate-Source Leakage
Gate-Source Threshold Voltage
Drain-Source On-Resistance (Note3)
Forward Transconductance (Note3)
Dynamic
IGSS
VGS(th)
RDS(on)
gfs
V
GS = ±30V
--
--
nA
V
VDS = VGS, ID = 250µA
VGS = 10V, ID = 0.7A
VDS = 10V, ID = 0.7A
2.5
--
--
3.6
1.0
Ω
S
--
Input Capacitance
Ciss
Coss
Crss
Qg
--
--
--
--
--
--
--
--
--
--
120
25
5
--
--
--
--
--
--
--
--
--
--
V
GS = 0V,
Output Capacitance
VDS = 50V,
f = 1.0MHz
pF
nC
Reverse Transfer Capacitance
Total Gate Charge
4.1
0.7
2.5
49
17
24
19
V
DD = 520V, ID = 1.4A,
Gate-Source Charge
Gate-Drain Charge
Qgs
Qgd
td(on)
tr
VGS = 10V
Turn-on Delay Time
Turn-on Rise Time
V
DD = 400V, ID = 1.4A,
ns
RG = 25Ω
Turn-off Delay Time
td(off)
tf
Turn-off Fall Time
Drain-Source Body Diode Characteristics
Continuous Body Diode Current
Pulsed Diode Forward Current
Body Diode Voltage
IS
ISM
VSD
trr
--
--
--
--
--
--
--
--
1.4
5.6
1.2
--
TC = 25ºC
A
TJ = 25ºC, ISD = 1.4A, VGS = 0V
0.9
76.6
0.3
3.1
V
ns
μC
A
Reverse Recovery Time
VR = 400V, IF = IS,
diF/dt = 100A/μs
Reverse Recovery Charge
Qrr
Irrm
--
Peak Reverse Recovery Current
--
Notes
1. Repetitive Rating: Pulse Width limited by maximum junction temperature
2. IAS = 0.5A, VDD = 50V, RG = 25Ω, Starting TJ = 25°C
3. Pulse Test: Pulse Width ≤ 300μs, Duty Cycle ≤ 1%
V3.0
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