TM497MBK36H, TM497MBK36I
4194304 BY 36-BIT
DYNAMIC RAM MODULES
SMMS676 – MARCH 1997
†
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Supply voltage range, V
(see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . – 1 V to 7 V
CC
Input voltage range (see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . – 1 V to 7 V
Short-circuit output current . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 50 mA
Power dissipation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12 W
Operating free-air temperature range, T
Storage temperature range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . – 55°C to 125°C
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0°C to 70°C
A
†
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTE 1: All voltage values are with respect to V
.
SS
recommended operating conditions
MIN NOM
MAX UNIT
V
V
V
Supply voltage
4.5
2.4
– 1
0
5
5.5
6.5
0.8
70
V
V
CC
IH
IL
High-level input voltage
Low-level input voltage (see Note 2)
Operating free-air temperature
V
T
A
°C
NOTE 2: The algebraic convention, where the more negative (less positive) limit is designated as minimum, is used in this data sheet for logic
voltage levels only.
electrical characteristics over recommended ranges of supply voltage and operating free-air
temperature (unless otherwise noted)
’497MBK36H/I-60 ’497MBK36H/I-70 ’497MBK36H/I-80
PARAMETER
TEST CONDITIONS
UNIT
MIN
MAX
MIN
MAX
MIN
MAX
High-level output
voltage
V
V
I
I
= – 5 mA
2.4
2.4
2.4
V
V
OH
OH
Low-level output
voltage
= 4.2 mA
0.4
± 120
± 10
0.4
± 120
± 10
0.4
± 120
± 10
OL
OL
Input current
(leakage)
V
= 5.5 V,
V = 0 V to 6.5 V,
I
CC
All other pins = 0 V to V
I
I
I
µA
µA
mA
I
CC
Output current
(leakage)
V
= 5.5 V,
V
= 0 V to V ,
CC
CC
CAS high
O
O
Read- or write-cycle
current (see Note 3)
V
V
= 5.5 V,
Minimum cycle
1300
1160
1040
CC1
CC
= 2.4 V (TTL),
IH
After one memory cycle,
RAS and CAS high
24
12
24
12
24
12
mA
mA
I
Standby current
CC2
V
= V
– 0.2 V (CMOS),
CC
IH
After one memory cycle,
RAS and CAS high
V
= 5.5 V,
Minimum cycle,
Average refresh
current (RAS-only
or CBR)
CC
RAS cycling,
I
I
1300
920
1160
800
1040
680
mA
mA
CC3
CAS high (RAS-only);
CAS before RAS (CBR)
(see Note 3)
Average page
current (see Note 4) RAS low,
V
= 5.5 V,
t
= MIN
CC
PC
CAS cycling
CC4
NOTES: 3. I
is measured with a maximum of one address change while RAS = V .
IL
is measured with a maximum of one address change while CAS = V .
IH
CC3
CC4
4.
I
5
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