TLV713
TLV713P
www.ti.com
SBVS195D –SEPTEMBER 2012–REVISED JULY 2013
Capacitor-Free, 150-mA, Low-Dropout Regulator
with Foldback Current Limit for Portable Devices
Check for Samples: TLV713, TLV713P
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FEATURES
DESCRIPTION
The TLV713 series of low-dropout (LDO) linear
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Stable Operation With or Without Capacitors
Foldback Overcurrent Protection
Package: SOT23-5 and X2SON
Very Low Dropout: 230 mV at 150 mA
Accuracy: 1%
regulators are low quiescent current LDOs with
excellent line and load transient performance and are
designed for power-sensitive applications. These
devices provide a typical accuracy of 1%.
The TLV713 series is designed to be stable without
an output capacitor. The removal of the output
capacitor allows for a very small solution size.
However, the TLV713 series is also stable with any
output capacitor if an output capacitor is used.
Low IQ: 50 µA
Input Voltage Range: 1.4 V to 5.5 V
Available in Fixed-Output Voltages:
1.0 V to 3.3 V
The TLV713 also provides inrush current control
during device power-up and enabling. The TLV713
limits the input current to the defined current limit to
avoid large currents from flowing from the input
power source. This functionality is especially
important in battery-operated devices.
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High PSRR: 65 dB at 1 kHz
APPLICATIONS
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PDAs and Battery-Powered Portable Devices
MP3 Players and Other Hand-Held Products
WLAN and Other PC Add-On Cards
The TLV713 series is available in standard DQN and
DBV packages. The TLV713P provides an active pull-
down circuit to quickly discharge output loads.
DQN Package
1-mm x 1-mm X2SON
(Top View)
DBV PACKAGE
SOT23-5
(Top View)
Typical Application Circuit
IN
4
EN
3
VIN
VOUT
IN
OUT
IN
GND
EN
1
5
4
OUT
NC
2
3
TLV713xx Series
On
2
1
EN
Off
OUT
GND
GND
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Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
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PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
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