TLV710 Series
TLV711 Series
www.ti.com
SBVS142A –JULY 2010–REVISED AUGUST 2010
Dual, 200mA, Low-IQ
Low-Dropout Regulator for Portable Devices
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FEATURES
DESCRIPTION
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Very Low Dropout:
The TLV710 and TLV711 series of dual, low-dropout
(LDO) linear regulators are low quiescent current
devices with excellent line and load transient
performance. These LDOs are designed for
power-sensitive applications. These devices provide
a typical accuracy of 2% over temperature.
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150mV at IOUT = 200mA and VOUT = 2.8V
75mV at IOUT = 100mA and VOUT = 2.8V
40mV at IOUT = 50mA and VOUT = 2.8V
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2% Accuracy Over Temperature
Low IQ of 35mA per Regulator
The TLV711 series provides an active pulldown
circuit to quickly discharge the outputs.
Multiple Fixed Output Voltage Combinations
Possible from 1.2V to 4.8V
In addition, the TLV711-D series of devices have
pull-down resistors at the EN pins. This design helps
in disabling the device when the signal-driving EN
pins are in a weak, indeterminate state (for example,
the GPIO of a processor that might be three-stated
during startup). The pull-down resistor pulls the
voltage to the EN pins down to 0V, thus disabling the
device.
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High PSRR: 70dB at 1kHz
Stable with Effective Capacitance of 0.1mF(1)
Over-Current and Thermal Protection
Dedicated VREF for Each Output Minimizes
Crosstalk
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Available in 1.5mm × 1.5mm SON-6 Package
(1)
The TLV710 and TLV711 series are available in a
1.5mm x 1.5mm SON-6 package, and are ideal for
handheld applications.
See the Input and Output Capacitor Requirements in the
Application Information section
APPLICATIONS
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Wireless Handsets, Smart Phones, PDAs
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MP3 Players and Other Handheld Products
TLV710
TLV711
1.5mm x 1.5mm SON-6
(TOP VIEW)
EN1
IN
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2
3
6
5
4
OUT1
OUT2
GND
EN2
Typical Application Circuit
VIN
VOUT1
IN
OUT1
OUT2
VOUT2
COUT2
EN1
EN2
COUT1
ON
ON
CIN
1mF
Ceramic
1mF
OFF
OFF
GND
Ceramic
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Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
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PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2010, Texas Instruments Incorporated