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TK16V60W PDF预览

TK16V60W

更新时间: 2024-11-29 20:00:47
品牌 Logo 应用领域
东芝 - TOSHIBA 双极性晶体管开关脉冲
页数 文件大小 规格书
10页 250K
描述
Transistors (Bipolar/MOSFETs/IGBTs) - MOSFETs - Power MOSFET - Nch 500V<VDSS≤700V

TK16V60W 技术参数

生命周期:Active包装说明:DFN, 4 PIN
Reach Compliance Code:unknown风险等级:5.74
雪崩能效等级(Eas):179 mJ外壳连接:DRAIN
配置:SINGLE WITH BUILT-IN DIODE最小漏源击穿电压:600 V
最大漏极电流 (Abs) (ID):15.8 A最大漏极电流 (ID):15.8 A
最大漏源导通电阻:0.19 ΩFET 技术:METAL-OXIDE SEMICONDUCTOR
JESD-30 代码:S-PSSO-N4元件数量:1
端子数量:4工作模式:ENHANCEMENT MODE
最高工作温度:150 °C封装主体材料:PLASTIC/EPOXY
封装形状:SQUARE封装形式:SMALL OUTLINE
极性/信道类型:N-CHANNEL最大功率耗散 (Abs):139 W
最大脉冲漏极电流 (IDM):63.2 A子类别:FET General Purpose Power
表面贴装:YES端子形式:NO LEAD
端子位置:SINGLE晶体管应用:SWITCHING
晶体管元件材料:SILICONBase Number Matches:1

TK16V60W 数据手册

 浏览型号TK16V60W的Datasheet PDF文件第2页浏览型号TK16V60W的Datasheet PDF文件第3页浏览型号TK16V60W的Datasheet PDF文件第4页浏览型号TK16V60W的Datasheet PDF文件第5页浏览型号TK16V60W的Datasheet PDF文件第6页浏览型号TK16V60W的Datasheet PDF文件第7页 
TK16V60W  
MOSFETs Silicon N-Channel MOS (DTMOS)  
TK16V60W  
1. Applications  
Switching Voltage Regulators  
2. Features  
(1) Low drain-source on-resistance: RDS(ON) = 0.16 (typ.)  
by used to Super Junction Structure : DTMOS  
(2) Easy to control Gate switching  
(3) Enhancement mode: Vth = 2.7 to 3.7 V (VDS = 10 V, ID = 0.79 mA)  
3. Packaging and Internal Circuit  
1: Gate  
2: Source1  
3,4: Source2  
5: Drain (Heatsink)  
Notice:  
Please use the source1 pin for  
gate input signal return. Make  
sure that the main current flows  
into the source2 pins.  
DFN8x8  
4. Absolute Maximum Ratings (Note) (Ta = 25unless otherwise specified)  
Characteristics  
Symbol  
Rating  
Unit  
V
Drain-source voltage  
Gate-source voltage  
Drain current (DC)  
Drain current (pulsed)  
Power dissipation  
VDSS  
VGSS  
ID  
600  
±30  
(Note 1)  
(Note 1)  
15.8  
63.2  
139  
A
IDP  
(Tc = 25)  
PD  
W
mJ  
A
Single-pulse avalanche energy  
Avalanche current  
(Note 2)  
EAS  
IAR  
179  
4
Reverse drain current (DC)  
Reverse drain current (pulsed)  
Channel temperature  
(Note 1)  
(Note 1)  
IDR  
15.8  
63.2  
150  
IDRP  
Tch  
Storage temperature  
Tstg  
-55 to 150  
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the  
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even  
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum  
ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
("Handling Precautions"/"Derating Concept and Methods") and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
2013-06-07  
Rev.1.0  
1

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