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THS1403-EP PDF预览

THS1403-EP

更新时间： 2024-01-21 13:58:29
品牌 Logo 应用领域
德州仪器 - TI 转换器
页数 文件大小 规格书
27页 646K
描述
14-BIT, 1/3/8 MSPS DSP COMPATIBLE ANALOG-TO-DIGITAL CONVERTERS WITH INTERNAL REFERENCE AND PGA

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THS1403-EP 技术参数

是否无铅： 不含铅是否Rohs认证： 符合
生命周期：Obsolete零件包装代码：QFP
包装说明：HTFQFP, TQFP48,.35SQ针数：48
Reach Compliance Code：compliantECCN代码：EAR99
HTS代码：8542.39.00.01风险等级：5.78
最大模拟输入电压：3.6 V最小模拟输入电压：
最长转换时间：0.333 µs转换器类型：ADC, PROPRIETARY METHOD
JESD-30 代码：S-PQFP-G48长度：7 mm
最大线性误差 (EL)：0.0183%模拟输入通道数量：1
位数：14功能数量：1
端子数量：48最高工作温度：125 °C
最低工作温度：-40 °C输出位码：BINARY, 2'S COMPLEMENT BINARY
输出格式：PARALLEL, WORD封装主体材料：PLASTIC/EPOXY
封装代码：HTFQFP封装等效代码：TQFP48,.35SQ
封装形状：SQUARE封装形式：FLATPACK, HEAT SINK/SLUG, THIN PROFILE, FINE PITCH
峰值回流温度（摄氏度）：NOT SPECIFIED电源：3.3 V
认证状态：Not Qualified采样速率：3 MHz
采样并保持/跟踪并保持：SAMPLE座面最大高度：1.2 mm
子类别：Other Converters标称供电电压：3.3 V
表面贴装：YES技术：CMOS
温度等级：AUTOMOTIVE端子形式：GULL WING
端子节距：0.5 mm端子位置：QUAD
处于峰值回流温度下的最长时间：NOT SPECIFIED宽度：7 mm
Base Number Matches：1

THS1403-EP 数据手册

 浏览型号THS1403-EP的Datasheet PDF文件第2页浏览型号THS1403-EP的Datasheet PDF文件第3页浏览型号THS1403-EP的Datasheet PDF文件第4页浏览型号THS1403-EP的Datasheet PDF文件第5页浏览型号THS1403-EP的Datasheet PDF文件第6页浏览型号THS1403-EP的Datasheet PDF文件第7页 
THS1401-EP THS1403-EP THS1408-EP  
14-BIT, 1/3/8 MSPS DSP COMPATIBLE ANALOG-TO-DIGITAL CONVERTERS  
WITH INTERNAL REFERENCE AND PGA  
SGLS129A – JULY 2002 – REVISED NOVEMBER 2002  
Integral Nonlinearity (INL) ±1.5 LSB Typ  
features  
Internal Reference  
Controlled Baseline  
– One Assembly/Test Site, One Fabrication  
Differential Inputs  
Site  
Programmable Gain Amplifier  
µP Compatible Parallel Interface  
Timing Compatible With TMS320C6000 DSP  
3.3-V Single Supply  
Extended Temperature Performance up to  
–55°C to 125°C  
Enhanced Diminishing Manufacturing  
Sources (DMS) Support  
Power-Down Mode  
Enhanced Product Change Notification  
Monolithic CMOS Design  
†
Qualification Pedigree  
14-Bit Resolution  
applications  
1, 3, and 8 MSPS Speed Grades  
Differential Nonlinearity (DNL) ±0.6 LSB Typ  
xDSL Front Ends  
Communication  
†
Component qualification in accordance with JEDEC and industry  
standards to ensure reliable operation over an extended  
temperature range. This includes, but is not limited to, Highly  
Accelerated Stress Test (HAST) or biased 85/85, temperature  
cycle, autoclave or unbiased HAST, electromigration, bond  
intermetallic life, and mold compound life. Such qualification  
testing should not be viewed as justifying use of this component  
beyond specified performance and environmental limits.  
Industrial Control  
Instrumentation  
Automotive and Selected Military  
PHP PACKAGE  
(TOP VIEW)  
48 47 46 45 44 43 42 41 40 39 38 37  
36  
35  
34  
33  
32  
31  
30  
29  
28  
27  
26  
25  
WR  
OE  
DGND  
DGND  
CLK  
IN–  
1
2
3
4
5
6
7
8
9
AV  
DD  
VBG  
CML  
REF+  
REF–  
AGND  
AGND  
DGND  
DV  
DD  
DV  
DD  
D0  
D1  
D2  
OV 10  
D13 11  
D12 12  
DV  
DD  
DGND  
13 14 15 16 17 18 19 20 21 22 23 24  
NC – No internal connection  
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
Copyright 2002, Texas Instruments Incorporated  
PRODUCTION DATA information is current as of publication date.  
Products conform to specifications per the terms of Texas Instruments  
standard warranty. Production processing does not necessarily include  
testing of all parameters.  
1
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265  
1234567...27

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