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TC7SZ126AFS(TPL3) PDF预览

TC7SZ126AFS(TPL3)

更新时间: 2024-11-20 14:36:15
品牌 Logo 应用领域
东芝 - TOSHIBA 驱动光电二极管逻辑集成电路
页数 文件大小 规格书
6页 158K
描述
TC7SZ126AFS(TPL3)

TC7SZ126AFS(TPL3) 技术参数

生命周期:Obsolete包装说明:DFP, FL6,.03,14
Reach Compliance Code:unknown风险等级:5.83
Is Samacsys:N控制类型:ENABLE HIGH
JESD-30 代码:R-PDFP-F6逻辑集成电路类型:BUS DRIVER
最大I(ol):0.024 A位数:1
功能数量:1端子数量:6
最高工作温度:85 °C最低工作温度:-40 °C
输出特性:3-STATE输出极性:TRUE
封装主体材料:PLASTIC/EPOXY封装代码:DFP
封装等效代码:FL6,.03,14封装形状:RECTANGULAR
封装形式:FLATPACK包装方法:TAPE AND REEL
电源:3.3 VProp。Delay @ Nom-Sup:6 ns
认证状态:Not Qualified子类别:Bus Driver/Transceivers
标称供电电压 (Vsup):3.3 V表面贴装:YES
技术:CMOS温度等级:INDUSTRIAL
端子形式:FLAT端子节距:0.35 mm
端子位置:DUALBase Number Matches:1

TC7SZ126AFS(TPL3) 数据手册

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TC7SZ126AFS  
TOSHIBA CMOS Digital Integrated Circuit Silicon Monolithic  
TC7SZ126AFS  
Bus Buffer 3-State Output  
Features  
High output current  
: ±24mA (min) at VCC = 3V  
Super high speed operation : t = 2.6 ns (typ.)  
pd  
at VCC = 5 V, C = 50 pF  
L
Operation voltage range  
5.5-V tolerant input  
ESD performance  
: VCC = 1.65 to 5.5V  
: Machine model ±200 V  
SON5-P-0.35  
(fSV)  
Human body model ±2000 V  
Weight: 0.001 g (typ.)  
Marking  
Pin Assignment (top view)  
Product Name  
IN A  
GND  
1
2
5
4
V
CC  
J X  
G
3
OUT Y  
Absolute Maximum Ratings (Ta = 25°C)  
Characteristics  
Supply voltage  
Symbol  
Rating  
Unit  
V
0.5 to 6  
0.5 to 6  
V
V
CC  
DC input voltage  
V
IN  
DC output voltage  
Input diode current  
Output diode current  
DC output current  
DC VCC/ground current  
Power dissipation  
Storage temperature  
V
0.5 to V +0.5  
V
OUT  
CC  
I
20  
±20  
mA  
mA  
mA  
mA  
mW  
°C  
IK  
I
(Note1)  
OK  
I
±50  
OUT  
I
±50  
CC  
P
50  
D
T
65 to 150  
stg  
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the  
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if  
the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum  
ratings and the operating ranges.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report  
and estimated failure rate, etc).  
Note 1: VOUT < GND, VOUT > VCC  
Start of commercial production  
2008-05  
1
2014-03-01  

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