SN54CBT3383, SN74CBT3383
10-BIT FET BUS-EXCHANGE SWITCHES
SCDS003J – NOVEMBER 1992 – REVISED MAY 1999
SN54CBT3383 . . . JT OR W PACKAGE
SN74CBT3383 . . . DB, DBQ, DGV, DW, OR PW PACKAGE
(TOP VIEW)
Functionally Equivalent to QS3383 and
QS3L383
5-Ω Switch Connection Between Two Ports
BE
1B1
1A1
1A2
1B2
2B1
2A1
2A2
2B2
V
CC
1
2
3
4
5
6
7
8
9
24
23
22
21
TTL-Compatible Input Levels
5B2
5A2
5A1
Package Options Include Plastic
Small-Outline (DW), Shrink Small-Outline
(DB, DBQ), Thin Very Small-Outline (DGV),
and Thin Shrink Small-Outline (PW)
Packages, Ceramic DIPs (JT), and Ceramic
Flat (W) Package
20 5B1
4B2
19
18 4A2
17 4A1
16 4B1
15 3B2
14 3A2
13 BX
description
3B1 10
3A1 11
GND 12
The ’CBT3383 devices provide ten bits of
high-speed TTL-compatible bus switching or
exchanging. The low on-state resistance of the
switch allows connections to be made with
minimal propagation delay.
The devices operate as a 10-bit bus switch or a 5-bit bus exchanger, which provides swapping of the A and B
pairs of signals. The bus-exchange function is selected when BX is high. The switches are connected when BE
is low.
The SN54CBT3383 is characterized for operation over the full military temperature range of –55°C to 125°C.
The SN74CBT3383 is characterized for operation from 0°C to 70°C.
FUNCTION TABLE
INPUTS
INPUTS/OUTPUTS
BE
BX
L
1A1–5A1
1B1–5B1
1B2–5B2
Z
1A2–5A2
1B2–5B2
1B1–5B1
Z
L
L
H
H
X
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
Copyright 1999, Texas Instruments Incorporated
On products compliant to MIL-PRF-38535, all parameters are tested
unless otherwise noted. On all other products, production
processing does not necessarily include testing of all parameters.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
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