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SM40-SR-FREQ-20J3GG PDF预览

SM40-SR-FREQ-20J3GG

更新时间: 2024-11-16 08:14:15
品牌 Logo 应用领域
PLETRONICS /
页数 文件大小 规格书
7页 115K
描述
Series - 3Rd Overtone Quartz Crystal, 25MHz Min, 70MHz Max, MINIATURE, SMD, 4 PIN

SM40-SR-FREQ-20J3GG 数据手册

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SM40 Series  
Miniature SMD Crystal  
January 2009  
• The Pletronics’ SM40 Series is a miniature  
surface mount crystal  
• The package is ideal for automated surface  
mount assembly and reflow practices.  
• Tape and Reel packaging  
• 3 MHz to 70 MHz  
• 5 x 13 x 4.2 mm 4 pad  
• AT Cut Crystal  
Pletronics Inc. certifies this device is in accordance with the  
RoHS 5/6 (2002/95/EC) and WEEE (2002/96/EC) directives.  
Pletronics Inc. guarantees the device does not contain the following:  
Cadmium, Hexavalent Chromium, Lead (<1000 ppm), Mercury, PBB’s, PBDE’s  
Weight of the Device: 0.65 grams  
Moisture Sensitivity Level: 1 As defined in J-STD-020C  
Second Level Interconnect code: e1, e2 or e3  
Electrical Specification:  
Item  
Min  
Max  
70  
Unit  
MHz  
Condition  
AT cut  
Frequency Range  
3
Calibration Frequency Tolerance  
Frequency Stability over OTR  
-
-
ppm  
at +25oC +_ 3oC  
see table on page 3  
for available options  
-
-
ppm  
Equivalent Series Resistance  
(ESR)  
-
200  
150  
120  
100  
80  
Ohms  
Ohms  
Ohms  
Ohms  
Ohms  
Ohms  
Ohms  
Ohms  
mW  
3 MHz to 4 MHz  
-
4 MHz to 5 MHz  
-
5 MHz to 6 MHz  
Fundamental  
3rd Overtone  
-
6 MHz to 7 MHz  
-
-
7 MHz to 8 MHz  
50  
8 MHz to13 MHz  
13 MHz to 30 MHz  
25 MHz to 70 MHz  
use 10 µW for testing  
Pad to Pad capacitance  
-
40  
-
100  
1
Drive Level  
-
Shunt Capacitance (C0)  
Aging  
-
7
pF  
-5  
-40  
-55  
+5  
ppm /Yr at +25oC +_ 3oC  
Specified Temperature Range  
Storage Temperature Range  
+85  
+125  
oC  
oC  
see table on page 3 for available options  
Product information is current as of publication date. The product conforms  
Copyright © 2006, 2007,2008 Pletronics  
Inc.  
to specifications per the terms of the Pletronics limited warranty. Production  
processsing does not necessarily include testing of all parameters.  

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