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SM2604T-6 PDF预览

SM2604T-6

更新时间: 2024-02-18 08:58:16
品牌 Logo 应用领域
铁电 - RAMTRON 时钟动态存储器光电二极管
页数 文件大小 规格书
33页 305K
描述
Synchronous DRAM, 4MX16, 4.3ns, CMOS, PDSO54, TSOP-54

SM2604T-6 技术参数

是否无铅: 含铅是否Rohs认证: 不符合
生命周期:Obsolete包装说明:TSOP, TSOP54,.46,32
Reach Compliance Code:unknownECCN代码:EAR99
HTS代码:8542.32.00.02风险等级:5.83
访问模式:FOUR BANK PAGE BURST最长访问时间:4.3 ns
其他特性:AUTO/SELF REFRESH最大时钟频率 (fCLK):166 MHz
I/O 类型:COMMON交错的突发长度:1,2,4,8
JESD-30 代码:R-PDSO-G54JESD-609代码:e0
内存密度:67108864 bit内存集成电路类型:SYNCHRONOUS DRAM
内存宽度:16功能数量:1
端口数量:1端子数量:54
字数:4194304 words字数代码:4000000
工作模式:SYNCHRONOUS最高工作温度:70 °C
最低工作温度:组织:4MX16
输出特性:3-STATE封装主体材料:PLASTIC/EPOXY
封装代码:TSOP封装等效代码:TSOP54,.46,32
封装形状:RECTANGULAR封装形式:SMALL OUTLINE
峰值回流温度(摄氏度):NOT SPECIFIED电源:2.5/3.3,3.3 V
认证状态:Not Qualified刷新周期:4096
自我刷新:YES连续突发长度:1,2,4,8,FP
子类别:Other Memory ICs最大供电电压 (Vsup):3.6 V
最小供电电压 (Vsup):3 V标称供电电压 (Vsup):3.3 V
表面贴装:YES技术:CMOS
温度等级:COMMERCIAL端子面层:Tin/Lead (Sn/Pb)
端子形式:GULL WING端子节距:0.8 mm
端子位置:DUAL处于峰值回流温度下的最长时间:NOT SPECIFIED
Base Number Matches:1

SM2604T-6 数据手册

 浏览型号SM2604T-6的Datasheet PDF文件第1页浏览型号SM2604T-6的Datasheet PDF文件第2页浏览型号SM2604T-6的Datasheet PDF文件第3页浏览型号SM2604T-6的Datasheet PDF文件第5页浏览型号SM2604T-6的Datasheet PDF文件第6页浏览型号SM2604T-6的Datasheet PDF文件第7页 
64Mbit – Enhanced SDRAM  
8Mx8, 4Mx16 ESDRAM  
Preliminary Datasheet  
General Description  
The 64Mbit ESDRAM is a high-speed SDRAM configured as four banks of DRAM with an SRAM row cache per bank  
and a synchronous interface. All inputs are registered and all outputs are driven on the rising edge of clock. Within each  
bank, the devices are organized as 4096 rows of 4096 bits each. Within each row, the 8Mx8 device has 512 column  
address locations and the 4Mx16 device has 256 column locations.  
Read and write accesses are accomplished by opening a row and selecting a column address location for the transaction.  
The Bank Activate command instructs the device to open a row in one of the four banks, though all four banks may be  
active simultaneously. A subsequent Read or Write command instructs the device to read data from or write data to a  
specified column address location.  
The device can be programmed to burst data in or out. Burst accesses start with the given column address location and  
continue until the burst length is satisfied. Throughout the burst, the device internally generates column addresses  
according to the burst type and burst length programmed into the Mode register.  
An early auto-precharge feature allows the device to self-time its row precharge one clock cycle after a Read command is  
issued, and one clock cycle following the last data word in a write burst. A precharge operation must occur before another  
row is opened within the same bank.  
Row Cache Operation  
The ESDRAM architecture combines four banks of fast 22.5 ns DRAM with a 10.5 ns SRAM row cache per bank to  
improve memory latency. Sustained high-speed bandwidth is achieved by pipelining operations internally. On a random  
read access, a DRAM bank is activated and data is latched into the sense amplifiers in 12 ns. The sense amplifiers now  
hold a row of data and the row is considered open. A Read command now causes the entire row to latch into the SRAM  
row cache, and the data at the specified column address location is driven out in 10.5 ns.  
Since the row data is latched into the SRAM row cache, the DRAM sense amplifiers are decoupled from the data. So the  
DRAM precharge time can be hidden behind a burst read from the row cache. This minimizes subsequent page miss  
latency. Since both precharge and RAS to CAS delays are hidden, the device supports an industry leading CAS latency of  
one at clock frequencies up to 83 MHz, and CAS latency of two up to 166 MHz.  
At 166 MHz, all but one cycle of the next random access to any location in the same bank can be hidden. This  
dramatically increases sustained bandwidth by up to two times over standard SDRAM. For interleaved burst read  
accesses, the entire precharge time is hidden and output data can be driven without any wait states.  
No Write Transfer Mode  
The ESDRAM architecture offers the system designer two different cache loading policies during write cycles. The cache  
loading policy is programmed via the Mode Register Set command.  
In Write Transfer (normal) mode the SRAM row cache is always loaded with the write data. This ensures coherency  
between the row cache and the DRAM array, and allows read-modify-write cycles and simplified memory control logic.  
In No Write Transfer mode, the row cache is not loaded during writes to the DRAM array. This allows continued access  
to the previously cached read data without incurring a page miss penalty (closing the write row and re-opening the read  
row). The ESDRAM can maintain four open read pages and four open write pages simultaneously in No Write Transfer  
mode. This subject is also covered in the section on the Mode Register Set command.  
Note: If a write hit occurs (the write page is already in the cache) the ESDRAM automatically updates the cache when the  
data is written to the DRAM array, regardless of the Write Transfer mode setting. This maintains coherency.  
This is a product in sampling or pre-production phase of development. Charac-  
teristic data and other specifications are subject to change without notice.  
Enhanced Memory Systems Inc., 1850 Ramtron Dr., Colo Spgs, CO 80921  
PHONE: (800) 545-DRAM; FAX: (719) 488-9095; http://www.edram.com  
Page 4 of 33  
Revision 1.1  

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