S29VS256R
S29VS128R
S29XS256R
S29XS128R
256/128 Mbit (32/16 Mbyte), 1.8 V, 16-bit
Data Bus, Multiplexed MirrorBit Flash
Features
Single 1.8 V supply for read/program/erase (1.70–1.95 V)
65 nm MirrorBit Technology
10-year data retention (typical)
Cycling Endurance: 100,000 cycles per sector (typical)
RDY output indicates data available to system
Command set compatible with JEDEC (42.4) standard
Hardware sector protection via VPP pin
Handshaking by monitoring RDY
Address and Data Interface Options
– Address and Data Multiplexed for reduced I/O count
(ADM) S29VS-R
– Address-High, Address-Low, Data Multiplexed for minimum I/O
count (AADM) S29XS-R
Offered Packages
Simultaneous Read/Write operation
32-word Write Buffer
Bank architecture
– 44-ball FBGA (6.2 mm x 7.7 mm x 1.0 mm)
Low VCC write inhibit
Write operation status bits indicate program and erase operation
– Eight-bank
completion
Four 32-KB sectors at the top or bottom of memory array 255/127 of
Suspend and Resume commands for Program and Erase
128-KB sectors
operations
Programmable linear (8/16-word) with wrap around and continuous
Asynchronous program operation, independent of burst control
burst read modes
register settings
Secured Silicon Sector region consisting of 128 words each for
VPP input pin to reduce factory programming time
Support for Common Flash Interface (CFI)
factory and customer
General Description
The Spansion S29VS256/128R and S29XS256/128R are MirrorBit® Flash products fabricated on 65 nm process technology. These
burst mode Flash devices are capable of performing simultaneous read and write operations with zero latency on two separate
banks using multiplexed data and address pins. These products can operate up to 108 MHz and use a single VCC of
1.7 V to 1.95 V that makes them ideal for the demanding wireless applications of today that require higher density, better
performance, and lowered power consumption. The S29VS256/128R operates in ADM mode, while the S29XS256/128R can
operate in the AADM mode.
Performance Characteristics
Read Access Times
Current Consumption (typical values)
Continuous Burst Read @ 108 MHz
Speed Option (MHz)
108
72.34
6.75
80
32 mA
71 mA
30 mA
30 µA
Max. Synch. Latency, ns (t
Simultaneous Operation @ 108 MHz
Program/Erase
IA)
Max. Synch. Burst Access, ns (t
BACC)
Max. Asynch. Access Time, ns (t
)
Standby Mode
ACC
Max OE# Access Time, ns (t
)
15
OE
Typical Program & Erase Times
Single Word Programming
Effective Write Buffer Programming (V ) Per Word
170 µs
14.1 µs
9 µs
CC
Effective Write Buffer Programming (V ) Per Word
PP
Sector Erase (16 Kword Sector)
Sector Erase (64 Kword Sector)
350 ms
800 ms
Cypress Semiconductor Corporation
Document Number: 002-00833 Rev. *H
•
198 Champion Court
•
San Jose, CA 95134-1709
•
408-943-2600
Revised December 21, 2015