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RTSX72SU-CQ256M PDF预览

RTSX72SU-CQ256M

更新时间: 2024-11-24 06:08:55
品牌 Logo 应用领域
ACTEL /
页数 文件大小 规格书
83页 735K
描述
RTSX-SU RadTolerant FPGAs (UMC)

RTSX72SU-CQ256M 数据手册

 浏览型号RTSX72SU-CQ256M的Datasheet PDF文件第2页浏览型号RTSX72SU-CQ256M的Datasheet PDF文件第3页浏览型号RTSX72SU-CQ256M的Datasheet PDF文件第4页浏览型号RTSX72SU-CQ256M的Datasheet PDF文件第5页浏览型号RTSX72SU-CQ256M的Datasheet PDF文件第6页浏览型号RTSX72SU-CQ256M的Datasheet PDF文件第7页 
v2.2  
RTSX-SU RadTolerant FPGAs (UMC)  
u
e
Designed for Space  
Features  
SEU-Hardened Registers Eliminate the Need to  
Implement Triple-Module Redundancy (TMR)  
Very Low Power Consumption (Up to 68 mW at  
Standby)  
Immune to Single-Event Upsets (SEU) to LETth  
3.3V and 5V Mixed Voltage  
Configurable I/O Support for 3.3V/5V PCI, LVTTL,  
TTL, and CMOS  
> 40 MeV-cm2/mg,  
SEU Rate < 10–10 Upset/Bit-Day in Worst-Case  
Geosynchronous Orbit  
5V Input Tolerance and 5V Drive Strength  
Slow Slew Rate Option  
Configurable Weak Resistor Pull-Up/Down for  
Tristated Outputs at Power-Up  
Up to 100 krad (Si) Total Ionizing Dose (TID)  
Parametric Performance Supported with Lot-  
Specific Test Data  
Hot-Swap  
Support  
Compliant  
with  
Cold-Sparing  
Single-Event Latch-Up (SEL) Immunity  
TM1019.5 Test Data Available  
QML Certified Devices  
Secure Programming Technology Prevents Reverse  
Engineering and Design Theft  
100% Circuit Resource Utilization with 100% Pin  
Locking  
Unique In-System Diagnostic and Verification  
Capability with Silicon Explorer II  
Low-Cost Prototyping Option  
Deterministic, User-Controllable Timing  
JTAG Boundary Scan Testing in Compliance with  
IEEE Standard 1149.1 – Dedicated JTAG Reset  
(TRST) Pin  
High Performance  
230 MHz System Performance  
310 MHz Internal Performance  
9.5 ns Input Clock to Output Pad  
Specifications  
0.25 µm Metal-to-Metal Antifuse Process (UMC)  
48,000 to 108,000 Available System Gates  
Up to 2,012 SEU-Hardened Flip-Flops  
Up to 360 User-Programmable I/O Pins  
Table 1 RTSX-SU Product Profile  
Device  
RTSX32SU  
RTSX72SU  
Capacity  
Typical Gates  
System Gates  
32,000  
48,000  
72,000  
108,000  
Logic Modules  
2,880  
1,800  
1,080  
6,036  
4,024  
2,012  
Combinatorial Cells  
SEU-Hardened Register Cells (Dedicated Flip-Flops)  
Maximum Flip-Flops  
Maximum User I/Os  
Clocks  
1,980  
227  
3
4,024  
360  
3
Quadrant Clocks  
Speed Grades  
0
4
Std., –1  
Std., –1  
Package (by pin count)  
CQFP  
CCGA  
CCLG  
84, 208, 256  
256  
208, 256  
624  
March 2006  
i
© 2006 Actel Corporation  
See the Actel website for the latest version of the datasheet  

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