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RO3193A
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Designed for 390 MHz Superheterodyne Receiver LOs
Very Low Series Resistance
Quartz Stability
379.3 MHz
SAW Resonator
Surface-mount Ceramic Case
Complies with Directive 2002/95/EC (RoHS)
Pb
The RO3193A is a one-port surface-acoustic-wave (SAW) resonator packaged in a surface-mount ceramic
case. It provides reliable, fundamental-mode quartz frequency stabilization of local oscillators operating at
379.3 MHz.
Absolute Maximum Ratings
Rating
Value
Units
CW RF Power Dissipation (See: Typical Test Circuit)
DC voltage Between Terminals (Observe ESD Precautions)
Case Temperature
+0
dBm
VDC
°C
±30
SM5035-4
-40 to +85
260
Soldering Temperature (10 seconds / 5 cycles maximum)
°C
Electrical Characteristics
Characteristic
Sym
Notes
2,3,4,5
2,5,6
Minimum
Typical
Maximum
379.4
±100
Units
MHz
fC
ΔfC
IL
Center Frequency (+25 °C)
Absolute Frequency
379.2
Tolerance from 379.3 MHz
kHz
dB
Insertion Loss
Quality Factor
1.6
12000
2000
25
2.0
QU
QL
TO
fO
Unloaded Q
5,6,7
50 Ω Loaded Q
Temperature Stability
Turnover Temperature
Turnover Frequency
10
40
°C
fC
6,7,8
ppm/°C2
ppm/yr
Frequency Temperature Coefficient
Absolute Value during the First Year
FTC
|fA|
0.032
≤10
Frequency Aging
1
5
DC Insulation Resistance between Any Two Terminals
1.0
MΩ
Ω
RM
LM
RF Equivalent RLC Model
Motional Resistance
Motional Inductance
Motional Capacitance
Shunt Static Capacitance
20
101
1.7
3.0
58
5, 7, 9
µH
fF
CM
CO
5, 6, 9
2, 7
pF
nH
LTEST
Test Fixture Shunt Inductance
Lid Symbolization (in addition to Lot and/or Date Codes)
832 // YYWWS
CAUTION: Electrostatic Sensitive Device. Observe precautions for handling.
NOTES:
1.
2.
Frequency aging is the change in f with time and is specified at +65 °C or less.
C
7.
Derived mathematically from one or more of the following directly measured
parameters: f , IL, 3 dB bandwidth, f versus T , and C .
Aging may exceed the specification for prolonged temperatures above +65 °C.
Typically, aging is greatest the first year after manufacture, decreasing in
subsequent years.
C
C
C
O
8.
Turnover temperature, T , is the temperature of maximum (or turnover)
O
frequency, f . The nominal frequency at any case temperature, T , may be
O
C
The center frequency, f , is measured at the minimum insertion loss point, IL
,
C
MIN
2
calculated from: f = f [1 - FTC (T -T ) ]. Typically oscillator T is
O
O
C
O
with the resonator in the 50 Ω test system (VSWR ≤ 1.2:1). The shunt
approximately equal to the specified resonator T .
O
inductance, L
, is tuned for parallel resonance with C at f . Typically,
O C
TEST
9.
This equivalent RLC model approximates resonator performance near the
f
or f
is approximately equal to the resonator f .
TRANSMITTER C
OSCILLATOR
resonant frequency and is provided for reference only. The capacitance C is
O
3.
4.
One or more of the following United States patents apply: 4,454,488 and
4,616,197.
Typically, equipment utilizing this device requires emissions testing and
the static (nonmotional) capacitance between the two terminals measured at low
frequency (10 MHz) with a capacitance meter. The measurement includes
parasitic capacitance with "NC” pads unconnected. Case parasitic capacitance
is approximately 0.05 pF. Transducer parallel capacitance can by calculated as:
government approval, which is the responsibility of the equipment manufacturer.
5.
6.
Unless noted otherwise, case temperature T = +25 ± 2 °C.
C
C
≈ C - 0.05 pF.
P
O
The design, manufacturing process, and specifications of this device are subject
to change without notice.
10. Tape and Reel standard per ANSI / EIA 481.
©2010-2015 by Murata Electronics N.A., Inc.
RO3193A (R) 2/11/15
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