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R1RW0408D PDF预览

R1RW0408D

更新时间: 2022-11-24 21:43:17
品牌 Logo 应用领域
瑞萨 - RENESAS 静态存储器
页数 文件大小 规格书
14页 86K
描述
4M High Speed SRAM (512-kword x 8-bit)

R1RW0408D 数据手册

 浏览型号R1RW0408D的Datasheet PDF文件第4页浏览型号R1RW0408D的Datasheet PDF文件第5页浏览型号R1RW0408D的Datasheet PDF文件第6页浏览型号R1RW0408D的Datasheet PDF文件第8页浏览型号R1RW0408D的Datasheet PDF文件第9页浏览型号R1RW0408D的Datasheet PDF文件第10页 
R1RW0408D Series  
AC Characteristics  
(Ta = 0 to +70°C, VCC = 3.3 V ± 0.3 V, unless otherwise noted.)  
Test Conditions  
Input pulse levels: 3.0 V/0.0 V  
Input rise and fall time: 3 ns  
Input and output timing reference levels: 1.5 V  
Output load: See figures (Including scope and jig)  
1.5 V  
3.3 V  
319Ω  
RL=50 Ω  
DOUT  
Zo=50 Ω  
DOUT  
353Ω  
30 pF  
5 pF  
Output load (A)  
Output load (B)  
(for tCLZ, tOLZ, tCHZ, tOHZ, tWHZ, and tOW  
)
Read Cycle  
R1RW0408D  
-2  
Symbol Min  
Parameter  
Max  
Unit  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
Notes  
Read cycle time  
tRC  
12  
Address access time  
tAA  
12  
12  
6
Chip select access time  
tACS  
tOE  
Output enable to output valid  
Output hold from address change  
Chip select to output in low-Z  
Output enable to output in low-Z  
Chip deselect to output in high-Z  
Output disable to output in high-Z  
tOH  
3
3
0
tCLZ  
tOLZ  
tCHZ  
tOHZ  
1
1
1
1
6
6
Rev.1.00, Mar.12.2004, page 7 of 12  

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