PD27025F
25 W, 2.5GHz - 2.7GHz , N-Channel E-Mode, Lateral MOSFET
Table 1. Thermal Characteristics
Introduction
Parameter
Sym
Value
Unit
The PD27025F is a high-voltage, gold-metalized,
laterally diffused metal oxide semiconductor
(LDMOS) RF power transistor suitable for
Thermal Resistance,
Junction to Case:
R JC
2.1
°C/W
2.5GHz - 2.7GHz Class AB wireless base station
amplifier applications.
This device is manufactured on an advanced LDMOS
technology, offering state-of-the-art performance,
reliability, and thermal resistance. Packaged in an
industry-standard CuW package capable of deliver
ing a minimum output power of 25 W, it is ideally
Table 2. Absolute Maximum Ratings*
Parameter
Drain-source Voltage
Gate-source Voltage
Drain Current—Continuous
Sym Value Unit
65 Vdc
VGS –0.5, +15 Vdc
VDSS
suited for today's RF power amplifier applications.
-
ID
4.25
83.5
Adc
W
Total Dissipation at TC = 70 °C: PD
Derate Above 70 °C:
—
0.4
W/°C
°C
Operating Junction Tempera-
ture
TJ
200
Storage Temperature Range
TSTG –65, +150 °C
* Stresses in excess of the absolute maximum ratings can cause
permanent damage to the device. These are absolute stress rat-
ings only. Functional operation of the device is not implied at
these or any other conditions in excess of those given in the
operational sections of the data sheet. Exposure to absolute
maximum ratings for extended periods can adversely affect
device reliability.
(flanged)
PD27025F
Figure 1. Available Packages
Features
Table 3. ESD Rating*
•
Application Specific Performance, 2.7 GHz
Minimum (V)
Class
HBM
MM
500
50
1B
A
•
Typical 2-Tone Performance
Average Load Power – 12.5 W
ηD – 30%
CDM
1500
4
Power Gain – 11.5 dB
IMD3: -30dBc @ -100kHz/ +100KHz
* Although electrostatic discharge (ESD) protection circuitry has
been designed into this device, proper precautions must be
taken to avoid exposure to ESD and electrical overstress (EOS)
PEAK Devices
during all handling, assembly, and test operations. Agere
•
Typical CW Performance
Average Load Power – 25 W
employs a human-body model (HBM), a machine model (MM),
and a charged-device model (CDM) qualification requirement in
order to determine ESD-susceptibility limits and protection
design evaluation. ESD voltage thresholds are dependent on the
circuit parameters used in each of the models, as defined by
JEDEC's JESD22-A114B (HBM), JESD22-A115A (MM), and
JESD22-C101A (CDM) standards.
ηD – 38%
Power Gain – 11.0 dB
Caution: MOS devices are susceptible to damage from elec-
trostatic charge. Reasonable precautions in han-
dling and packaging MOS devices should be
observed.