I N F R A R E D D E T E C T O R
MCT photoconductive detector
P3257/P3981/P2750 series
Non-cooled type and TE-cooled type suitable for long, continuous operation
Features
Applications
Choice of spectral response (up to 12 µm)
The band gap can be adjusted by controlling the composition
ratio of HgTe and CdTe. Utilizing this fact, various types are
available in different spectral characteristics.
Photoconductive element that decreases its resistance
by input of infrared light
Radiation thermometer
Gas analyzer
Infrared spectrophotometer
FTIR
CO2 laser monitor
Custom devices available
Accessories (Optional)
Custom devices not listed in this catalog are also
available with different spectral response, active area
size and number of element.
Heatsink for two-stage TE-cooler
A3179-01
(Can also be used with P3257-31)
Heatsink for three-stage TE-cooler A3179-04
Temperature controller C1103-05 (-25 to -75 ˚C)
C1103-07 (20 to -30 ˚C)
Easy-to-use infrared detector modules with preamp
available
Preamp
C5185-01 (P3981/P2750 series)
(Preamp for P3257-30/-31 available upon request)
Infrared detector modules with preamp
P4631-10 (P3257-31)
P4631
(P3981)
P4631-04 (P2750)
ꢀ General ratings / Absolute maximum ratings
Absolute maximum ratings
Dimensional
outline/
Active
area
Thermistor TE-cooler
Operating
temperature temperature
Storage
Allowable
current
Type No.
Package
Cooling
power
dissipation
(mW )
allowable
current
W indow
Topr
(°C)
Tstg
(°C)
material *1
(mm)
(A)
-
(mA)
50
P3257-30
ꢀ/Se
ꢀ/Se
with BNC connector Non-cooled
-
O ne-stage
TE-cooled
P3257-31
TO-8
1.5
50
P3981
ꢀ/S
ꢀ/S
ꢀ/S
TO-8
1 × 1
3
3
6
6
3
Two-stage
TO-66
-40 to +60 -55 to +60
P3981-01
P2750-08
P2750
0.2
TE-cooled
TO-8
1.0
Three-stage
TE-cooled
ꢀ/S
TO-3
P2750-06
0.25 × 0.25
*1: W indow material S : Sapphire glass
Se: ZnSe
ꢀ Electrical and optical characteristics (Typ. unless otherwise noted)
Measurement
P eak
sensitivity
wavelength
λ p
Photo
sensitivity *2
S
λ =λ p *3
condition
Elem ent
tem perature
T
Cut-off
wavelength
λ c
Rise time
tr
0 to 63 %
Dark
resistance
Rd
D
D
NEP
(500, 1200, 1) *4
(
λ
p *3, 1200, 1) λ =λ p *3
Type No.
Min.
Typ.
1/2
1/2
(°C)
25
0
(µm)
6.5
7.0
(µm)
11.0
11.5
(V/W )
2 × 10-3
5 × 10-3
(cm ·H z /W ) (cm ·H z /W ) (cm·Hz1/2/W ) (W /Hz1/2
)
(µs)
1 (ns)
1 (ns)
(Ω)
30
35
P3257-30
P3257-31
P3981
P3981-01
P2750-08
P2750
5.0 × 105 3.0 × 106
1.0 × 106 6.0 × 106
2.0 × 105
5.0 × 105
5.0 × 10-7
2.0 × 10-7
3.6
4.8
4.8
4.3
5.4
5.5
1 × 104
5.0 × 108 5.0 × 109 1.3 × 1011 7.7 × 10-13
10
2
600
160
200
-30
-60
3 × 102
2 × 103
3 × 103
3.0 × 108 3.0 × 109 1.5 × 1010 6.7 × 10-12
2.2 × 10-12
1.0 × 109 9.0 × 109 4.5 × 1010
5.0 × 10-13
3
P2750-06
*2: Photo sensitivity changes with the bias current. The values in the above table are measured with the optimum bias current.
*3: P3257-30/-31: λ =10.6 µm
*4: P3257-30/-31: (800, 1200, 1)
1