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P1144-3SDESV PDF预览

P1144-3SDESV

更新时间: 2024-02-27 00:26:42
品牌 Logo 应用领域
PLETRONICS 振荡器时钟
页数 文件大小 规格书
7页 82K
描述
P113SD Series 3.3 V CMOS Clock Oscillators

P1144-3SDESV 技术参数

生命周期:Obsolete包装说明:,
Reach Compliance Code:unknown风险等级:5.84
Base Number Matches:1

P1144-3SDESV 数据手册

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P113SD Series 3.3 V  
CMOS Clock Oscillators  
July 2007  
• Pletronics’ P113SD Series is a quartz crystal  
controlled precision square wave generator  
with a CMOS output.  
• 70 to 180 MHz  
• Full Size Thru-Hole DIP package  
• Enable/Disable Function  
• The P113SD series will directly interface TTL  
devices also.  
• Greatly reduces RFI and EMI system sensitivity  
• Minimizes RFI radiation, eases meeting FCC  
Class B emissions standards.  
• Disable function includes low standby power  
mode  
• 3rd Overtone Crystals used  
• Improved circuit to minimize oscillator issues  
such as multi-mode output signal.  
• Low Jitter  
• Has internal bypass capacitor on the Vcc lead  
• 5x7 mm LCC ceramic oscillator inside  
• Capable of driving up to 50pF capacitive loads  
• Tube packaging is available.  
Pletronics Inc. certifies this device is in accordance with the  
RoHS (2002/95/EC) and WEEE (2002/96/EC) directives.  
Pletronics Inc. guarantees the device does not contain the following:  
Cadmium, Hexavalent Chromium, Lead, Mercury, PBB’s, PBDE’s  
Weight of the Device: 4.0 grams  
Moisture Sensitivity Level: 1 As defined in J-STD-020C  
Second Level Interconnect code: e1 or e2  
Absolute Maximum Ratings:  
Parameter  
Unit  
VCC Supply Voltage  
Vi Input Voltage  
Vo Output Voltage  
-0.5V to +7.0V  
-0.5V to VCC + 0.5V  
-0.5V to VCC + 0.5V  
Thermal Characteristics  
The maximum die or junction temperature is 155oC  
The thermal resistance junction to board is 120oC/Watt depending on the solder pads, ground plane and  
construction of the PCB.  
Product informatin is current as of publication date. The product conforms  
to specifications per the terms of the Pletronics standard warranty. Production  
processsing does not necesarily include testing of all parameters.  
Copyright © 2005, 2006, 2007 Pletronics Inc.  

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