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OPA140ATDD1 PDF预览

OPA140ATDD1

更新时间: 2024-10-02 11:45:59
品牌 Logo 应用领域
德州仪器 - TI 输出元件
页数 文件大小 规格书
4页 71K
描述
HIGH-PRECISION, LOW-NOISE, RAIL-TO-RAIL OUTPUT

OPA140ATDD1 技术参数

生命周期:Active包装说明:DIE-8
Reach Compliance Code:not_compliantFactory Lead Time:6 weeks
风险等级:2.19放大器类型:OPERATIONAL AMPLIFIER
最大平均偏置电流 (IIB):0.00001 µA最小共模抑制比:126 dB
标称共模抑制比:140 dB最大输入失调电压:120 µV
JESD-30 代码:R-XUUC-N8长度:1.448 mm
功能数量:1端子数量:8
封装主体材料:UNSPECIFIED封装代码:DIE
封装形状:RECTANGULAR封装形式:UNCASED CHIP
标称压摆率:20 V/us子类别:Operational Amplifier
最大压摆率:2 mA表面贴装:YES
端子形式:NO LEAD端子位置:UPPER
标称均一增益带宽:11000 kHz宽度:0.846 mm
Base Number Matches:1

OPA140ATDD1 数据手册

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OPA140A-DIE  
www.ti.com  
SBOS610B MARCH 2012REVISED MARCH 2012  
HIGH-PRECISION, LOW-NOISE, RAIL-TO-RAIL OUTPUT,  
11-MHZ JFET OPERATIONAL AMPLIFIER  
Check for Samples: OPA140A-DIE  
1
FEATURES  
Very Low Offset Drift  
APPLICATIONS  
Very Low Offset  
Battery-Powered Instruments  
Low Input Bias Current  
Very Low 1/f Noise  
Industrial Controls  
Medical Instrumentation  
Photodiode Amplifiers  
Active Filters  
Low Noise  
Slew Rate  
Low Supply Current  
Data Acquisition Systems  
Automatic Test Systems  
Input Voltage Range Includes V– Supply  
Single-Supply Operation: 4.5 V to 36 V  
Dual-Supply Operation: ±2.25 V to ±18 V  
No Phase Reversal  
DESCRIPTION  
The OPA140A operational amplifier is a low-power JFET input amplifier that features good drift and low input  
bias current. The rail-to-rail output swing and input range that includes V– allow designers to take advantage of  
the low-noise characteristics of JFET amplifiers while also interfacing to modern, single-supply, precision analog-  
to-digital converters (ADCs) and digital-to-analog converters (DACs). The OPA140A runs on a single 4.5-V to  
36-V supply or dual ±2.25-V to ±18-V supplies.  
ORDERING INFORMATION(1)  
PACKAGE  
DESIGNATOR  
PRODUCT  
PACKAGE(2)  
ORDERABLE PART NUMBER  
PACKAGE QUANTITY  
OPA140ATDD1  
OPA140ATDD2  
252  
10  
OPA140A  
TD  
Bare Die In Waffle Pack  
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI  
web site at www.ti.com.  
(2) Processing is per the Texas Instruments commercial production baseline and is in compliance with the Texas Instruments Quality  
Control System in effect at the time of manufacture. Electrical screening consists of DC parametric and functional testing at room  
temperature only. Unless otherwise specified by Texas Instruments AC performance and performance over temperature is not  
warranted. Visual Inspection is performed in accordance with MIL-STD-883 Test Method 2010 Condition B at 75X minimum.  
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
PRODUCTION DATA information is current as of publication date.  
Copyright © 2012, Texas Instruments Incorporated  
Products conform to specifications per the terms of the Texas  
Instruments standard warranty. Production processing does not  
necessarily include testing of all parameters.  

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