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MSP430F5632IPZ PDF预览

MSP430F5632IPZ

更新时间: 2024-12-01 10:44:51
品牌 Logo 应用领域
德州仪器 - TI 微控制器
页数 文件大小 规格书
106页 1254K
描述
MIXED SIGNAL MICROCONTROLLER

MSP430F5632IPZ 技术参数

是否无铅: 不含铅是否Rohs认证: 符合
生命周期:Active零件包装代码:QFP
包装说明:LFQFP, QFP100,.63SQ,20针数:100
Reach Compliance Code:compliantECCN代码:3A991.A.2
HTS代码:8542.31.00.01风险等级:1.71
具有ADC:YES其他特性:OPERATES AT 1.8V SUPPLY AT 8MHZ
地址总线宽度:位大小:16
边界扫描:YESCPU系列:MSP430
最大时钟频率:32 MHzDAC 通道:NO
DMA 通道:YES外部数据总线宽度:
格式:FIXED POINT集成缓存:NO
JESD-30 代码:S-PQFP-G100JESD-609代码:e4
长度:14 mm低功率模式:YES
湿度敏感等级:3DMA 通道数量:6
外部中断装置数量:I/O 线路数量:74
串行 I/O 数:4端子数量:100
计时器数量:4片上数据RAM宽度:8
片上程序ROM宽度:8最高工作温度:85 °C
最低工作温度:-40 °CPWM 通道:YES
封装主体材料:PLASTIC/EPOXY封装代码:LFQFP
封装等效代码:QFP100,.63SQ,20封装形状:SQUARE
封装形式:FLATPACK, LOW PROFILE, FINE PITCH峰值回流温度(摄氏度):260
电源:2/3.3 V认证状态:Not Qualified
RAM(字节):16384RAM(字数):16
ROM(单词):262144ROM可编程性:FLASH
座面最大高度:1.6 mm速度:20 MHz
子类别:Microcontrollers最大供电电压:3.6 V
最小供电电压:2.4 V标称供电电压:3 V
表面贴装:YES技术:CMOS
温度等级:INDUSTRIAL端子面层:Nickel/Palladium/Gold (Ni/Pd/Au)
端子形式:GULL WING端子节距:0.5 mm
端子位置:QUAD处于峰值回流温度下的最长时间:NOT SPECIFIED
宽度:14 mmuPs/uCs/外围集成电路类型:MICROCONTROLLER, RISC
Base Number Matches:1

MSP430F5632IPZ 数据手册

 浏览型号MSP430F5632IPZ的Datasheet PDF文件第2页浏览型号MSP430F5632IPZ的Datasheet PDF文件第3页浏览型号MSP430F5632IPZ的Datasheet PDF文件第4页浏览型号MSP430F5632IPZ的Datasheet PDF文件第5页浏览型号MSP430F5632IPZ的Datasheet PDF文件第6页浏览型号MSP430F5632IPZ的Datasheet PDF文件第7页 
MSP430F563x  
www.ti.com  
SLAS650B JUNE 2010REVISED AUGUST 2011  
MIXED SIGNAL MICROCONTROLLER  
1
FEATURES  
2
Low Supply Voltage Range: 1.8 V to 3.6 V  
Two Universal Serial Communication  
Interfaces  
Ultralow Power Consumption  
USCI_A0 and USCI_A1 Each Supporting  
Active Mode (AM):  
All System Clocks Active:  
270 µA/MHz at 8 MHz, 3.0 V, Flash Program  
Execution (Typical)  
Enhanced UART Supporting  
Auto-Baudrate Detection  
IrDA Encoder and Decoder  
Synchronous SPI  
Standby Mode (LPM3):  
Watchdog With Crystal, and Supply  
Supervisor Operational, Full RAM  
Retention, Fast Wake-Up:  
USCI_B0 and USCI_B1 Each Supporting  
I2CTM  
Synchronous SPI  
1.8 µA at 2.2 V, 2.1 µA at 3.0 V (Typical)  
Full-Speed Universal Serial Bus (USB)  
Shutdown RTC Mode (LPM3.5):  
Shutdown Mode, Active Real-Time Clock  
With Crystal:  
Integrated USB-PHY  
Integrated 3.3-V/1.8-V USB Power System  
Integrated USB-PLL  
1.1 µA at 3.0 V (Typical)  
Shutdown Mode (LPM4.5):  
0.3 µA at 3.0 V (Typical)  
Eight Input, Eight Output Endpoints  
12-Bit Analog-to-Digital (A/D) Converter With  
Internal Shared Reference, Sample-and-Hold,  
and Autoscan Feature  
Wake-Up From Standby Mode in 3 µs (Typical)  
16-Bit RISC Architecture, Extended Memory,  
up to 20-MHz System Clock  
Dual 12-Bit Digital-to-Analog (D/A) Converters  
With Synchronization  
Flexible Power Management System  
Fully Integrated LDO With Programmable  
Regulated Core Supply Voltage  
Voltage Comparator  
Hardware Multiplier Supporting 32-Bit  
Operations  
Supply Voltage Supervision, Monitoring,  
and Brownout  
Serial Onboard Programming, No External  
Programming Voltage Needed  
Unified Clock System  
FLL Control Loop for Frequency  
Stabilization  
Six-Channel Internal DMA  
Real-Time Clock Module With Supply Voltage  
Backup Switch  
Low-Power/Low-Frequency Internal Clock  
Source (VLO)  
Family Members are Summarized in Table 1  
Low-Frequency Trimmed Internal Reference  
Source (REFO)  
For Complete Module Descriptions, See the  
MSP430x5xx/MSP430x6xx Family User's Guide  
(SLAU208)  
32-kHz Crystals (XT1)  
High-Frequency Crystals Up to 32 MHz  
(XT2)  
Four 16-Bit Timer With 3, 5, or 7  
Capture/Compare Registers  
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas  
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
2
All trademarks are the property of their respective owners.  
PRODUCTION DATA information is current as of publication date.  
Products conform to specifications per the terms of the Texas  
Instruments standard warranty. Production processing does not  
necessarily include testing of all parameters.  
Copyright © 20102011, Texas Instruments Incorporated  

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