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MC14511B_14

更新时间： 2024-11-30 01:18:15
品牌 Logo 应用领域
安森美 - ONSEMI /
页数 文件大小 规格书
10页 137K
描述
BCD-to-Seven Segment Latch/Decoder/Drive

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MC14511B_14 数据手册

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MC14511B  
BCD-to-Seven Segment  
Latch/Decoder/Driver  
The MC14511B BCD−to−seven segment latch/decoder/driver is  
constructed with complementary MOS (CMOS) enhancement mode  
devices and NPN bipolar output drivers in a single monolithic structure.  
The circuit provides the functions of a 4−bit storage latch, an 8421  
BCD−to−seven segment decoder, and an output drive capability. Lamp  
test (LT), blanking (BI), and latch enable (LE) inputs are used to test the  
display, to turn−off or pulse modulate the brightness of the display, and  
to store a BCD code, respectively. It can be used with seven−segment  
light−emitting diodes (LED), incandescent, fluorescent, gas discharge,  
or liquid crystal readouts either directly or indirectly.  
http://onsemi.com  
SOIC−16  
D SUFFIX  
CASE 751B  
SOEIAJ−16  
F SUFFIX  
CASE 966  
SO−16 WB  
DW SUFFIX  
CASE 751G  
Applications include instrument (e.g., counter, DVM, etc.) display  
driver, computer/calculator display driver, cockpit display driver, and  
various clock, watch, and timer uses.  
MARKING DIAGRAMS  
16  
16  
Features  
MC14511B  
14511BG  
ALYWG  
AWLYWW  
• Low Logic Circuit Power Dissipation  
• High−Current Sourcing Outputs (Up to 25 mA)  
• Latch Storage of Code  
1
1
SOIC−16  
SOEIAJ−16  
• Blanking Input  
16  
• Lamp Test Provision  
14511B  
• Readout Blanking on all Illegal Input Combinations  
• Lamp Intensity Modulation Capability  
• Time Share (Multiplexing) Facility  
• Supply Voltage Range = 3.0 V to 18 V  
AWLYYWWG  
1
SO−16 WB  
• Capable of Driving Two Low−power TTL Loads, One Low−power  
Schottky TTL Load, or Two HTL Loads Over the Rated Temperature  
Range  
A
= Assembly Location  
= Year  
WL, L = Wafer Lot  
YY, Y  
WW, W = Work Week  
G
• Chip Complexity: 216 FETs or 54 Equivalent Gates  
• Triple Diode Protection on all Inputs  
= Pb−Free Package  
• NLV Prefix for Automotive and Other Applications Requiring  
Unique Site and Control Change Requirements; AEC−Q100  
Qualified and PPAP Capable  
ORDERING INFORMATION  
See detailed ordering and shipping information in the package  
dimensions section on page 7 of this data sheet.  
• These Devices are Pb−Free and are RoHS Compliant  
MAXIMUM RATINGS (Voltages Referenced to V ) (Note 1)  
SS  
Symbol  
Parameter  
Value  
Unit  
V
V
DD  
DC Supply Voltage Range  
−0.5 to +18.0  
V
Input Voltage Range, All Inputs  
DC Current Drain per Input Pin  
−0.5 to V + 0.5  
V
in  
DD  
I
10  
500  
mA  
mW  
°C  
P
Power Dissipation, per Package (Note 2)  
Operating Temperature Range  
D
T
A
−55 to +125  
−65 to +150  
25  
T
stg  
Storage Temperature Range  
°C  
I
Maximum Output Drive Current (Source) per Output  
Maximum Continuous Output Power (Source) per Output (Note 3)  
mA  
mA  
OHmax  
P
50  
OHmax  
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality  
should not be assumed, damage may occur and reliability may be affected.  
1. Maximum Ratings are those values beyond which damage to the device may occur.  
2. Temperature Derating: “D/DW” Packages: –7.0 mW/°C From 65°C to 125°C  
3. P  
= I (V − V  
)
OHmax  
OH  
DD  
OH  
© Semiconductor Components Industries, LLC, 2014  
1
Publication Order Number:  
July, 2014 − Rev. 12  
MC14511B/D  
 
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