MC14001B Series
B-Suffix Series CMOS Gates
MC14001B, MC14011B, MC14023B,
MC14025B, MC14071B, MC14073B,
MC14081B, MC14082B
The B Series logic gates are constructed with P and N channel
enhancement mode devices in a single monolithic structure
(Complementary MOS). Their primary use is where low power
dissipation and/or high noise immunity is desired.
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MARKING
Features
DIAGRAMS
• Supply Voltage Range = 3.0 Vdc to 18 Vdc
14
PDIP−14
P SUFFIX
CASE 646
• All Outputs Buffered
MC140xxBCP
AWLYYWWG
• Capable of Driving Two Low−power TTL Loads or One Low−power
Schottky TTL Load Over the Rated Temperature Range.
• Double Diode Protection on All Inputs Except: Triple Diode
Protection on MC14011B and MC14081B
• Pin−for−Pin Replacements for Corresponding CD4000 Series
B Suffix Devices
1
14
SOIC−14
D SUFFIX
CASE 751A
140xxBG
AWLYWW
1
• These Devices are Pb−Free and are RoHS Compliant
14
• NLV Prefix for Automotive and Other Applications Requiring
Unique Site and Control Change Requirements; AEC−Q100
Qualified and PPAP Capable
14
0xxB
ALYWG
G
TSSOP−14
DT SUFFIX
CASE 948G
MAXIMUM RATINGS (Voltages Referenced to V
)
SS
1
Symbol
Parameter
Value
−0.5 to +18.0
Unit
V
xx
A
WL, L
YY, Y
= Specific Device Code
= Assembly Location
= Wafer Lot
V
DD
DC Supply Voltage Range
V , V
in out
Input or Output Voltage Range
(DC or Transient)
−0.5 to V + 0.5
V
DD
= Year
WW, W = Work Week
I , I
in out
Input or Output Current
(DC or Transient) per Pin
10
mA
G or G
= Pb−Free Package
(Note: Microdot may be in either location)
P
D
Power Dissipation, per Package
(Note 1)
500
mW
DEVICE INFORMATION
T
Ambient Temperature Range
Storage Temperature Range
−55 to +125
−65 to +150
260
°C
°C
°C
A
Device
MC14001B
MC14011B
Description
T
stg
Quad 2−Input NOR Gate
Quad 2−Input NAND Gate
T
Lead Temperature
(8−Second Soldering)
L
V
ESD Withstand Voltage
Human Body Model
Machine Model
V
MC14023B
MC14025B
MC14071B
MC14073B
Triple 3−Input NAND Gate
Triple 3−Input NOR Gate
Quad 2−Input OR Gate
Triple 3−Input AND Gate
ESD
> 3000
> 300
N/A
Charged Device Model
Stresses exceeding Maximum Ratings may damage the device. Maximum
Ratings are stress ratings only. Functional operation above the Recommended
Operating Conditions is not implied. Extended exposure to stresses above the
Recommended Operating Conditions may affect device reliability.
1. Temperature Derating:
MC14081B
MC14082B
Quad 2−Input AND Gate
Dual 4−Input AND Gate
Plastic “P and D/DW” Packages: – 7.0 mW/_C From 65_C To 125_C
This device contains protection circuitry to guard against damage due to high
static voltages or electric fields. However, precautions must be taken to avoid
applications of any voltage higher than maximum rated voltages to this
ORDERING INFORMATION
See detailed ordering and shipping information in the package
dimensions section on page 8 of this data sheet.
high−impedance circuit. For proper operation, V and V should be constrained
in
out
to the range V v (V or V ) v V
.
SS
in
out
DD
Unused inputs must always be tied to an appropriate logic voltage level
(e.g., either V or V ). Unused outputs must be left open.
SS
DD
© Semiconductor Components Industries, LLC, 2013
1
Publication Order Number:
April, 2013 − Rev. 10
MC14001B/D