FUJITSU SEMICONDUCTOR
DATA SHEET
DS04-13200-3E
LINEAR IC
1 CHANNEL 8-BIT D/A
CONVERTER
MB4072
1 CHANNEL 8-BIT D/A CONVERTER
The Fujitsu MB4072 is a High-Speed Digital to Analog Converter IC. The
MB4072’s current outputs are high impedance open-collector, which provide
voltage output with a load or current to voltage converter for various applications
with operational amplifiers, microcomputers, etc.
Threshold level of digital inputs is variable with the level control input for various
interface level.
• Settling Time
• Linearity Error
• Full-scale Temperature coefficient: ±10ppm/°C typ.
• Output Voltage Compliance : -10V to +18V
• Multiplying Operation
: 85ns
: ±0.19%max.
PLASTIC PACKAGE
DIP-16P-M04
• True/Complimentary Current Sink Output
• Adjustable Threshold Level of Digital Inputs :Interface directly with
TTL, CMOS, ECL, etc.
• Wide Supply Voltage Range : ±4.5V to ±18V
PLASTIC PACKAGE
FPT-16P-M06
• Low Power Consumption
• Operation Temperature
• Compatible with DAC-08
• Package
: 33mW at ±5V typ.
: -40°C to +85°C
: Plastic DIP Package: (Suffix: -P)
Plastic FPT Package: (Suffix: -PF)
PIN ASSIGNMENT
■ ABSOLUTE MAXIMUM RATINGS
COMP
VREF(-)
VREF(+)
V+
VLC
IOUT
1
2
3
4
5
6
7
8
16
15
14
13
12
11
10
9
(TA =25°C)
Parameter
Supply Voltage
Symbol
Value
37
Unit
V
V-
V+ to V-
VI
IOUT
Digital Input Voltage
V- to V- +37
V- to V+
V- to V+
V- to V+
V
TOP VIEW
B8(LSB)
B7
Threshold Control Voltage
VLC
V
(MSB)B1
B2
VREF(+)
VREF(-)
V
Reference Input Voltage
V
B6
B3
Differential Reference Input
Voltage
VREF(+) to VREF(-)
±18.5
V
B5
B4
Reference Input Current
Power Consumption
Storage Temp.
IREF
PD
5
mA
mW
°C
500
TSTG
-55 to +125
This device contains circuitry to protect the inputs against
damage dueto high static voltages or electric fields. However,
it is advised that normal precautions be taken to avoid
applicationofanyvoltagehigherthanmaximumratedvoltages
to this high impedance circuit.
NOTE: Permanent device damage may occur if the above Absolute Maximum
Ratings are exceeded. Functional operation should be restricted to the
conditions as detailed in the operational sections of this data sheet. Exposure
to absolute maximum rating conditions for extended periods may affect device
reliability.
1