'97.4.7
MITSUBISHI LSIs
M5M5256DFP,VP,RV -70VLL,-85VLL,
-70VXL,-85VXL
262144-BIT (32768-WORD BY 8-BIT) CMOS STATIC RAM
AC ELECTRICAL CHARACTERISTICS (Ta = 0~70°C, Vcc=3.3±0.3V, unless otherwise noted )
(1) MEASUREMENT CONDITIONS
Input pulse level··················I·HV=2.2V,VIL=0.4V
Input rise and fall time··········5ns
Reference level···················O·VH=VOL=1.5V
DQ
Output loads·························Fig.1,CL=30pF (-70VLL,-70VXL )
CL=50pF (-85VLL,-85VXL )
CL
(Including
scope and JIG)
CL=5pF (for ten,tdis)
Transition is measured ±500mV from steady
state voltage. (for ten,tdis)
Fig.1 Output load
(2) READ CYCLE
Limits
Unit
Symbol
Parameter
Read cycle time
-70VLL, VXL -85VLL, VXL
Min Max Min Max
ns
ns
ns
ns
ns
ns
ns
ns
ns
tCR
70
85
ta(A)
ta(S)
ta(OE)
tdis(S)
Address access time
70
70
35
25
25
85
85
45
25
25
Chip select access time
Output enable access time
Output disable time after /S high
tdis(OE) Output disable time after /OE high
ten(S)
Output enable time after /S low
ten(OE) Output enable time after /OE low
5
5
10
10
10
10
tV(A)
Data valid time after address
(3) WRITE CYCLE
Limits
-70VLL, VXL -85VLL, VXL
Min Max Min Max
Symbol
Parameter
Unit
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
tCW
tw(W)
tsu(A)
tsu(A-WH)
tsu(S)
tsu(D)
th(D)
trec(W)
tdis(W)
tdis(OE)
ten(W)
ten(OE)
70
55
0
85
60
0
Write cycle time
Write pulse width
Address setup time
Address setup time with respect to /W high
Chip select setup time
Data setup time
Data hold time
Write recovery time
Output disable time from /W low
Output disable time from /OE high
Output enable time from /W high
Output enable time from /OE low
65
65
30
0
70
70
35
0
0
0
25
25
25
25
5
5
10
10
MITSUBISHI
ELECTRIC
4