5秒后页面跳转
M471B5773CHS-CH9 PDF预览

M471B5773CHS-CH9

更新时间: 2024-01-19 00:44:03
品牌 Logo 应用领域
三星 - SAMSUNG 时钟动态存储器双倍数据速率内存集成电路
页数 文件大小 规格书
33页 951K
描述
DDR DRAM Module, 256MX8, 0.25ns, CMOS, HALOGEN FREE AND ROHS COMPLIANT, SODIMM-204

M471B5773CHS-CH9 技术参数

是否Rohs认证: 符合生命周期:Obsolete
零件包装代码:DMA包装说明:DIMM, DIMM204,24
针数:204Reach Compliance Code:unknown
ECCN代码:EAR99HTS代码:8542.32.00.36
风险等级:5.58访问模式:SINGLE BANK PAGE BURST
最长访问时间:0.25 ns其他特性:AUTO/SELF REFRESH
最大时钟频率 (fCLK):667 MHzI/O 类型:COMMON
JESD-30 代码:R-XDMA-N204长度:67.6 mm
内存密度:2147483648 bit内存集成电路类型:DDR DRAM MODULE
内存宽度:8功能数量:1
端口数量:1端子数量:204
字数:268435456 words字数代码:256000000
工作模式:SYNCHRONOUS最高工作温度:85 °C
最低工作温度:组织:256MX8
输出特性:3-STATE封装主体材料:UNSPECIFIED
封装代码:DIMM封装等效代码:DIMM204,24
封装形状:RECTANGULAR封装形式:MICROELECTRONIC ASSEMBLY
峰值回流温度(摄氏度):NOT SPECIFIED电源:1.5 V
认证状态:Not Qualified刷新周期:8192
座面最大高度:3.8 mm自我刷新:YES
最大待机电流:0.096 A子类别:DRAMs
最大压摆率:1.68 mA最大供电电压 (Vsup):1.575 V
最小供电电压 (Vsup):1.425 V标称供电电压 (Vsup):1.5 V
表面贴装:NO技术:CMOS
温度等级:OTHER端子形式:NO LEAD
端子节距:0.6 mm端子位置:DUAL
处于峰值回流温度下的最长时间:NOT SPECIFIED宽度:30 mm
Base Number Matches:1

M471B5773CHS-CH9 数据手册

 浏览型号M471B5773CHS-CH9的Datasheet PDF文件第4页浏览型号M471B5773CHS-CH9的Datasheet PDF文件第5页浏览型号M471B5773CHS-CH9的Datasheet PDF文件第6页浏览型号M471B5773CHS-CH9的Datasheet PDF文件第8页浏览型号M471B5773CHS-CH9的Datasheet PDF文件第9页浏览型号M471B5773CHS-CH9的Datasheet PDF文件第10页 
Rev. 1.22  
Unbuffered SODIMM  
datasheet  
DDR3 SDRAM  
6. Input/Output Functional Description  
Symbol  
Type  
Function  
The system clock inputs. All address and command lines are sampled on the cross point of the rising edge of CK and  
falling edge of CK. A Delay Locked Loop (DLL) circuit is driven from the clock inputs and output timing for read opera-  
tions is synchronized to the input clock.  
CK0-CK1  
CK0-CK1  
Input  
Activates the DDR3 SDRAM CK signal when high and deactivates the CK signal when low. By deactivating the clocks,  
CKE low initiates the Power Down mode or the Self Refresh mode.  
CKE0-CKE1  
S0-S1  
Input  
Input  
Input  
Enables the associated DDR3 SDRAM command decoder when low and disables the command decoder when high.  
When the command decoder is disabled, new commands are ignored but previous operations continue. Rank 0 is  
selected by S0; Rank 1 is selected by S1.  
When sampled at the cross point of the rising edge of CK and falling edge of CK, signals CAS, RAS, and WE define  
the operation to be executed by the SDRAM.  
RAS, CAS, WE  
BA0-BA2  
Input  
Input  
Selects which DDR3 SDRAM internal bank of eight is activated.  
ODT0-ODT1  
Asserts on-die termination for DQ, DM, DQS, and DQS signals if enabled via the DDR3 SDRAM mode register.  
During a Bank Activate command cycle, defines the row address when sampled at the cross point of the rising edge of  
CK and falling edge of CK. During a Read or Write command cycle, defines the column address when sampled at the  
cross point of the rising edge of CK and falling edge of CK. In addition to the column address, AP is used to invoke  
autoprecharge operation at the end of the burst read or write cycle. If AP is high, autoprecharge is selected and BA0-  
BAn defines the bank to be precharged. If AP is low, autoprecharge is disabled. During a Precharge command cycle,  
AP is used in conjunction with BA0-BAn to control which bank(s) to precharge. If AP is high, all banks will be pre-  
charged regardless of the state of BA0-BAn inputs. If AP is low, then BA0-BAn are used to define which bank to pre-  
charge.A12(BC) is sampled during READ and WRITE commands to determine if burst chop (on-the fly) will be  
performed (HIGH, no burst chop; LOW, burst chopped)  
A0-A9,  
A10/AP,  
A11  
A12/BC  
A13-A15  
Input  
DQ0-DQ63  
DM0-DM7  
I/O  
Data Input/Output pins.  
The data write masks, associated with one data byte. In Write mode, DM operates as a byte mask by allowing input  
data to be written if it is low but blocks the write operation if it is high. In Read mode, DM lines have no effect.  
Input  
The data strobes, associated with one data byte, sourced with data transfers. In Write mode, the data strobe is  
sourced by the controller and is centered in the data window. In Read mode, the data strobe is sourced by the DDR3  
SDRAMs and is sent at the leading edge of the data window. DQS signals are complements, and timing is relative to  
the crosspoint of respective DQS and DQS.  
DQS0-DQS7  
DQS0-DQS7  
I/O  
VDD,VDDSPD,  
VSS  
Supply  
Supply  
I/O  
Power supplies for core, I/O, Serial Presence Detect, Temp sensor, and ground for the module.  
Reference voltage for SSTL15 inputs.  
VREFDQ,  
VREFCA  
This is a bidirectional pin used to transfer data into or out of the SPD EEPROM and Temp sensor. A resistor must be  
connected from the SDA bus line to VDDSPD on the system planar to act as a pull up.  
SDA  
SCL  
SA0-SA1  
TEST  
Input  
Input  
I/O  
This signal is used to clock data into and out of the SPD EEPROM and Temp sensor.  
Address pins used to select the Serial Presence Detect and Temp sensor base address.  
The TEST pin is reserved for bus analysis tools and is not connected on normal memory modules  
RESET In Active Low This signal resets the DDR3 SDRAM  
RESET  
Input  
- 7 -  

与M471B5773CHS-CH9相关器件

型号 品牌 描述 获取价格 数据表
M471B5773DH0-CH9 SAMSUNG DDR DRAM Module, 256MX64, 0.255ns, CMOS, SODIMM-204

获取价格

M471B5773DH0-CMA SAMSUNG DDR DRAM Module, 256MX64, 0.195ns, CMOS, SODIMM-204

获取价格

M471B6474DZ1-CF7 SAMSUNG DDR DRAM Module, 64MX64, 0.4ns, CMOS, ROHS COMPLIANT, SO-DIMM-204

获取价格

M471B6474DZ1-CG8 SAMSUNG DDR DRAM Module, 64MX64, CMOS, ROHS COMPLIANT, SO-DIMM-204

获取价格

M471B6474DZ1-CH9 SAMSUNG DDR DRAM Module, 64MX64, 0.255ns, CMOS, ROHS COMPLIANT, SO-DIMM-204

获取价格

M-476 LITTELFUSE Littelfuse Push Pull Switches are designed for universal applications within harsh environ

获取价格