M27C405
Table 5. AC Measurement Conditions
High Speed
≤ 10ns
Standard
≤ 20ns
Input Rise and Fall Times
Input Pulse Voltages
0 to 3V
1.5V
0.4V to 2.4V
0.8V and 2V
Input and Output Timing Ref. Voltages
Figure 3. AC Testing Input Output Waveform
Figure 4. AC Testing Load Circuit
1.3V
High Speed
1N914
3V
1.5V
3.3kΩ
0V
DEVICE
UNDER
TEST
OUT
Standard
C
L
2.4V
2.0V
0.8V
0.4V
C
C
C
= 30pF for High Speed
= 100pF for Standard
includes JIG capacitance
L
L
L
AI01822
AI01823B
(1)
Table 6. Capacitance
Symbol
(T = 25 °C, f = 1 MHz)
A
Parameter
Test Condition
Min
Max
6
Unit
pF
C
V
= 0V
= 0V
Input Capacitance
Output Capacitance
IN
IN
C
V
OUT
12
pF
OUT
Note: 1. Sampled only, not 100% tested.
DEVICE OPERATION
dresses are stable, the address access time
(t
(t
of t
) is equal to the delay from E to output
). Data is available at the output after a delay
AVQV
ELQV
The modes of operations of the M27C405 are list-
ed in the Operating Modes table. A single power
supply is required in the read mode. All inputs are
TTL levels except for V and 12V on A9 for Elec-
tronic Signature.
from the falling edge of G, assuming that
GLQV
E has been low and the addresses have been sta-
PP
ble for at least t
-t
.
AVQV GLQV
Standby Mode
Read Mode
The M27C405 has a standby mode which reduces
the active current from 30mA to 100µA. The
M27C405 is placed in the standby mode by apply-
ing a CMOS high signal to the E input. When in the
standby mode, the outputs are in a high imped-
ance state, independent of the G input.
The M27C405 has two control functions, both of
which must be logically active in order to obtain
data at the outputs. Chip Enable (E) is the power
control and should be used for device selection.
Output Enable (G) is the output control and should
be used to gate data to the output pins, indepen-
dent of device selection. Assuming that the ad-
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