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LV7744DEW-125.0M-T1K PDF预览

LV7744DEW-125.0M-T1K

更新时间: 2024-11-25 14:43:15
品牌 Logo 应用领域
PLETRONICS 机械振荡器
页数 文件大小 规格书
8页 1009K
描述
LVDS Output Clock Oscillator

LV7744DEW-125.0M-T1K 技术参数

生命周期:Active包装说明:LCC-6
Reach Compliance Code:compliant风险等级:5.71
其他特性:STANDBY; ENABLE/DISABLE FUNCTION; TR, EMBOSSED, 7/10/13 INCH最长下降时间:0.7 ns
频率调整-机械:NO频率稳定性:25%
安装特点:SURFACE MOUNT标称工作频率:125 MHz
最高工作温度:85 °C最低工作温度:-40 °C
振荡器类型:LVDS物理尺寸:7.0mm x 5.0mm x 1.7mm
最长上升时间:0.7 ns最大供电电压:2.75 V
最小供电电压:2.25 V标称供电电压:2.5 V
表面贴装:YES最大对称度:55/45 %
Base Number Matches:1

LV7744DEW-125.0M-T1K 数据手册

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LV77D Series 2.5 V  
LVDS Clock Oscillators  
February 2016  
• Pletronics’ LV77D Series is a quartz crystal  
controlled precision square wave generator with  
an LVDS output.  
• 5 x 7 mm LCC Ceramic Package  
• Enable/Disable Function on pad 1  
• Disable function includes low standby power  
mode  
• The package is designed for high density surface  
mount designs.  
• Low Jitter  
• Low cost mass produced oscillator.  
• Tape and Reel or cut tape packaging is available.  
• 80 MHz ~ 325 MHz  
Pletronics Inc. certifies this device is in accordance with the  
RoHS 6/6 (2011/65/EC) and WEEE (2002/96/EC) directives.  
Pletronics Inc. guarantees the device does not contain the following:  
Cadmium, Hexavalent Chromium, Lead, Mercury, PBB’s, PBDE’s  
Weight of the Device: 0.16 grams  
Moisture Sensitivity Level: 1 As defined in J-STD-020D.1  
Second Level Interconnect code: e4  
Absolute Maximum Ratings:  
Parameter  
Unit  
V
Supply Voltage  
-0.5V to +5.0V  
CC  
Vi  
Input Voltage  
-0.5V to V + 0.5V  
CC  
Vo Output Voltage  
-0.5V to V + 0.5V  
CC  
Thermal Characteristics  
o
The maximum die or junction temperature is 155 C  
o
The thermal resistance junction to board is 30 to 50 C/Watt depending on the solder pads, ground plane  
and construction of the PCB.  
Product information is current as of publication date. The product conforms  
Copyright © 2010, Pletronics  
Inc.  
to specifications per the terms of the Pletronics standard warranty. Production  
processsing does not necessarily include testing of all parameters.  

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