LTC2175-14/
LTC2174-14/LTC2173-14
converTer characTerisTics The l denotes the specifications which apply over the full operating
temperature range, otherwise specifications are at TA = 25°C. (Note 5)
LTC2175-14
TYP
LTC2174-14
TYP
LTC2173-14
TYP MAX
PARAMETER
CONDITIONS
MIN
14
MAX
MIN
MAX
MIN
UNITS
Bits
l
l
l
l
Resolution (No Missing Codes)
Integral Linearity Error
Differential Linearity Error
Offset Error
14
14
Differential Analog Input (Note 6)
Differential Analog Input
(Note 7)
–4.1
–0.9
–12
1.2
0.3
3
4.1
0.9
12
–3.25
–0.8
–12
1
0.3
3
3.25 –2.75
1
0.3
3
2.75
0.8
12
LSB
LSB
mV
0.8
12
–0.8
–12
Gain Error
Internal Reference
External Reference
–1.3
–1.3
–1.3
–1.3
–1.3
–1.3
%FS
%FS
l
–2.6
0
–2.6
0
–2.6
0
Offset Drift
20
20
20
µV/°C
Full-Scale Drift
Internal Reference
External Reference
35
25
35
25
35
25
ppm/°C
ppm/°C
Gain Matching
Offset Matching
Transition Noise
External Reference
0.2
3
0.2
3
0.2
3
%FS
mV
External Reference
1.2
1.2
1.2
LSB
RMS
analog inpuT The l denotes the specifications which apply over the full operating temperature range, otherwise
specifications are at TA = 25°C. (Note 5)
SYMBOL PARAMETER
CONDITIONS
1.7V < V < 1.9V
MIN
TYP
MAX
UNITS
+
–
l
l
l
V
V
V
Analog Input Range (A – A
)
+
1 to 2
V
P-P
IN
IN
IN
DD
–
Analog Input Common Mode (A + A )/2 Differential Analog Input (Note 8)
V
CM
– 100mV
0.625
V
CM
V
CM
+ 100mV
1.300
V
IN(CM)
SENSE
INCM
IN
IN
External Voltage Reference Applied to SENSE External Reference Mode
1.250
V
I
Analog Input Common Mode Current
Per Pin, 125Msps
Per Pin, 105Msps
Per Pin, 80Msps
155
130
100
µA
µA
µA
+
–
l
l
l
I
I
I
t
t
Analog Input Leakage Current No Encode
PAR/SER Input Leakage Current
0 < A , A < V
,
DD
–1
–3
–6
1
3
6
µA
µA
µA
ns
IN1
IN
IN
0 < PAR/SER < V
IN2
DD
SENSE Input Leakage Current
0.625 < SENSE < 1.3V
IN3
Sample-and-Hold Acquisition Delay Time
Sample-and-Hold Acquisition Delay Jitter
Analog Input Common Mode Rejection Ratio
Full-Power Bandwidth
0
AP
0.15
80
ps
RMS
JITTER
CMRR
BW-3B
dB
Figure 6 Test Circuit
800
MHz
21754314fa
3