Datasheet > LQH32PN100MNC#

LQH32PN100MNC#

更新时间： 2023-09-03 20:28:11

品牌	Logo	应用领域
村田 - MURATA		/
页数	文件大小	规格书
9页	509K
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数据手册

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LQH32PN100MNC# 数据手册

Spec No.: JELF243A_0091H-01

No. Item

P3/9

Specification

Test method

8.3 Vibration

Appearance shall have no significant

mechanical damage.

Oscillation frequency: 10 Hz to 2000 Hz to 10 Hz, for

approx. 20 min

Total amplitude: total amplitude of 1.5 mm or

acceleration amplitude of 98 m/s², whichever is smaller

Test time: 3 directions perpendicular to each other, 2 h

for each direction (6 h in total)

8.4 Solderability

90% or more of the outer electrode shall Flux: immersed in ethanol solution with a rosin content

be covered with new solder seamlessly. of 25(wt)% for 5 s to 10 s

Solder: Sn-3.0Ag-0.5Cu solder

Pre-heating: 150°C±10°C/60 s to 90 s

Solder temperature: 240°C±5°C

Immersion time: 3 s±1 s

8.5 Resistance to

soldering heat

Appearance: No significant mechanical

damage shall be observed.

Flux: immersed in ethanol solution with a rosin content

of 25(wt)% for 5 s to 10 s

Inductance change rate: within ±5%

Solder: Sn-3.0Ag-0.5Cu solder

Pre-heating: 150°C±10°C/60 s to 90 s

Solder temperature: 270°C±5°C

Immersion time: 10 s±1 s

Post-treatment: left at a room condition for 24 h±2 h

9. Environmental Performance

The product is soldered on a substrate for test.

No.

Item

Specification

Test method

9.1 Heat resistance

9.2 Cold resistance

9.3 Humidity

Appearance: No significant mechanical

damage shall be observed.

Inductance change rate: within ±5%

DC resistance change rate: within ±5%

Temperature: 85°C±2°C

Test time: 1000 h (+48 h, -0 h)

Post-treatment: left at a room condition for 24 h±2 h

Appearance: No significant mechanical

damage shall be observed.

Inductance change rate: within ±5%

DC resistance change rate: within ±5%

Temperature: -40°C±2°C

Test time: 1000 h (+48 h, -0 h)

Post-treatment: left at a room condition for 24 h±2 h

Appearance: No significant mechanical

damage shall be observed.

Inductance change rate: within ±5%

DC resistance change rate: within ±5%

Temperature: 40°C±2°C

Humidity: 90% (RH) to 95% (RH)

Test time: 1000 h (+48 h, -0 h)

Post-treatment: left at a room condition for 24 h±2 h

9.4 Temperature cycle Appearance: No significant mechanical

damage shall be observed.

Single cycle conditions:

Step 1: -40°C±2°C/30 min±3 min

Inductance change rate: within ±5%

DC resistance change rate: within ±5%

Step 2: ordinary temperature/10 min to 15 min

Step 3: +85°C±2°C/30 min±3 min

Step 4: ordinary temperature/10 min to 15 min

Number of testing: 10 cycles

Post-treatment: left at a room condition for 24 h±2 h

MURATA MFG CO., LTD

1 234 5 6 7...9

中文翻译

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与LQH32PN100MNC#相关器件

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LQH32PN121MN0#	MURATA	获取价格
LQH32PN121MN0K	MURATA	获取价格	Chip Inductor (Chip Coil) Power Inductor (Wire Wound Type)
LQH32PN121MN0L	MURATA	获取价格	Chip Inductor (Chip Coil) Power Inductor (Wire Wound Type)
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