Datasheet > LQH32PN100MNC#

LQH32PN100MNC#

更新时间： 2023-09-03 20:28:11

品牌	Logo	应用领域
村田 - MURATA		/
页数	文件大小	规格书
9页	509K
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数据手册

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LQH32PN100MNC# 数据手册

Spec No.: JELF243A_0091H-01

No. Item

P3/9

Specification

Test method

8.3 Vibration

Appearance shall have no significant

mechanical damage.

Oscillation frequency: 10 Hz to 2000 Hz to 10 Hz, for

approx. 20 min

Total amplitude: total amplitude of 1.5 mm or

acceleration amplitude of 98 m/s², whichever is smaller

Test time: 3 directions perpendicular to each other, 2 h

for each direction (6 h in total)

8.4 Solderability

90% or more of the outer electrode shall Flux: immersed in ethanol solution with a rosin content

be covered with new solder seamlessly. of 25(wt)% for 5 s to 10 s

Solder: Sn-3.0Ag-0.5Cu solder

Pre-heating: 150°C±10°C/60 s to 90 s

Solder temperature: 240°C±5°C

Immersion time: 3 s±1 s

8.5 Resistance to

soldering heat

Appearance: No significant mechanical

damage shall be observed.

Flux: immersed in ethanol solution with a rosin content

of 25(wt)% for 5 s to 10 s

Inductance change rate: within ±5%

Solder: Sn-3.0Ag-0.5Cu solder

Pre-heating: 150°C±10°C/60 s to 90 s

Solder temperature: 270°C±5°C

Immersion time: 10 s±1 s

Post-treatment: left at a room condition for 24 h±2 h

9. Environmental Performance

The product is soldered on a substrate for test.

No.

Item

Specification

Test method

9.1 Heat resistance

9.2 Cold resistance

9.3 Humidity

Appearance: No significant mechanical

damage shall be observed.

Inductance change rate: within ±5%

DC resistance change rate: within ±5%

Temperature: 85°C±2°C

Test time: 1000 h (+48 h, -0 h)

Post-treatment: left at a room condition for 24 h±2 h

Appearance: No significant mechanical

damage shall be observed.

Inductance change rate: within ±5%

DC resistance change rate: within ±5%

Temperature: -40°C±2°C

Test time: 1000 h (+48 h, -0 h)

Post-treatment: left at a room condition for 24 h±2 h

Appearance: No significant mechanical

damage shall be observed.

Inductance change rate: within ±5%

DC resistance change rate: within ±5%

Temperature: 40°C±2°C

Humidity: 90% (RH) to 95% (RH)

Test time: 1000 h (+48 h, -0 h)

Post-treatment: left at a room condition for 24 h±2 h

9.4 Temperature cycle Appearance: No significant mechanical

damage shall be observed.

Single cycle conditions:

Step 1: -40°C±2°C/30 min±3 min

Inductance change rate: within ±5%

DC resistance change rate: within ±5%

Step 2: ordinary temperature/10 min to 15 min

Step 3: +85°C±2°C/30 min±3 min

Step 4: ordinary temperature/10 min to 15 min

Number of testing: 10 cycles

Post-treatment: left at a room condition for 24 h±2 h

MURATA MFG CO., LTD

1 234 5 6 7...9

中文翻译

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与LQH32PN100MNC#相关器件

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LQH32PN121MN0#	MURATA	获取价格
LQH32PN121MN0K	MURATA	获取价格	Chip Inductor (Chip Coil) Power Inductor (Wire Wound Type)
LQH32PN121MN0L	MURATA	获取价格	Chip Inductor (Chip Coil) Power Inductor (Wire Wound Type)
LQH32PN150MN0	MURATA	获取价格	Chip Inductor (Chip Coil) Power Inductor (Wire Wound Type)

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